Model-Based Testing for Embedded Systems

Justyna Zander is a postdoctoral research scientist at Harvard University (Harvard Humanitarian Initiative) in Cambridge (Boston Area) MA, USA (since 2009) and Project Manager at the Fraunhofer Institute for Open Communication Systems in Berlin, Germany (since 2004). She holds Ph.D. (2008) and M.Sc. (2005), both in the fields of Computer Science and Electrical Engineering from Technical University Berlin in Germany, B.Sc. (2004) in Computer Science, and B.Sc. in Environmental Protection and Management from Gdansk University of Technology in Poland (2003). She graduated from the Singularity University, Mountain View, CA, USA as one of the forty participants selected from 1200 applications in 2009. For her scientific efforts Dr. Zander received grants and scholarships from such institutions as Polish Prime Ministry (1999-2000), Polish Ministry of Education and Sport awarded to 0.04% students in Poland (2001–2004), German Academic Exchange Service (2002), European Union (2003-2004), Hertie Foundation (2004-2005), IFIP TC6 (2005), IEEE (2006), Siemens (2007), Metodos y Tecnologia (2008), Singularity University (2009), and Fraunhofer Gesellschaft (2009-2010). Her doctoral thesis on model-based testing was supported by the German National Academic Foundation with a grant awarded to 0.31% students in Germany (2005-2008). Ina Schieferdecker studied Mathematical Computer Science at Humboldt-University Berlin and did her Ph.D. in 1994 at Technical University Berlin on performance-extended specifications and analysis of Quality of Service characteristics. Since 1997, she is heading the Competence Center for Testing, Interoperability and Performance (TIP) at the Fraunhofer Institute on Open Communication Systems (FOKUS), Berlin and is heading now the Competence Center Modelling and Testing for System and Service Solutions (MOTION). She is Professor on Engineering and Testing of Telecommunication Systems at Technical University Berlin since 2003. Prof. Schieferdecker works since 1994 in the area of design, analysis, testing and evaluation of communication systems using specification-based techniques like Unified Modeling Language, Message Sequence Charts and Testing and Test Control Notation (TTCN-3). Prof. Schieferdecker authored many scientific publications in the area of system development and testing. She is co-founder of the Testing Technologies IST GmbH, Berlin and member of the German Testing Board. She received in 2004 the Alfried Krupp von Bohlen und Halbach Award for Young Professors and became member of the German Academy of Technical Sciences in 2009. Her work on this book has partially being supported by the Alfried Krupp von Bohlen und Halbach Stiftung. Pieter J. Mosterman is a Senior Research Scientist at MathWorks in Natick, MA where he works on core Simulink® simulation and code generation technologies and an Adjunct Professor at the School of Computer Science of McGill University. Before, he was a Research Associate at the German Aerospace Center (DLR) in Oberpfaffenhofen. He has a Ph.D. degree in Electrical and Computer Engineering from Vanderbilt University in Nashville, TN, and a M.Sc. degree in Electrical Engineering from the University of Twente, Netherlands. His primary research interests are in Computer Automated Multiparadigm Modeling (CAMPAM) with principal applications in design automation, training systems, and fault detection, isolation, and reconfiguration. He designed the Electronics Laboratory Simulator, nominated for The Computerworld Smithsonian Award by Microsoft Corporation in 1994. In 2003, he was awarded the IMechE Donald Julius Groen Prize for a paper on HyBrSim, a hybrid bond graph modeling and simulation environment. Prof. Mosterman received the The Society for Modeling and Simulation International (SCS) Distinguished Service Award in 2009 for his services as Editor-in-Chief of SIMULATION: Transactions of SCS. Dr. Mosterman is or was involved as Associate Editor with the International Journal of Critical Computer Based Systems, the Journal of Defense Modeling and Simulation, the International Journal of Control and Automation, Applied Intelligence, and IEEE Transactions on Control Systems Technology (TCST).

Part I: Introduction

A Taxonomy of Model-Based Testing for Embedded Systems from Multiple Industry Domains. Behavioral System Models versus Models of Testing Strategies in Functional Test Generation. Test Framework Architectures for Model-Based Embedded System Testing.

Part II: Automatic Test Generation

Automatic Model-Based Test Generation from UML State Machines. Automated Statistical Testing for Embedded Systems. How to Design Extended Finite State Machine Test Models in Java. Automatic Testing of LUSTRE/SCADE Programs. Test Generation Using Symbolic Animation of Models.

Part III: Integration and Multi-level Testing

Model-Based Integration Testing with Communication Sequence Graphs. A Model-Based View onto Testing: Criteria for the Derivation of Entry Tests for Integration Testing. Multilevel Testing for Embedded Systems. Model-Based X-in-the-Loop Testing.

Part IV: Specific Approaches

A Survey of Model-Based Software Product Lines Testing. Model-Based Testing of Hybrid Systems. Reactive Testing of Nondeterministic Systems by Test Purpose-Directed Tester. Model-Based Passive Testing of Safety-Critical Components.

Part V: Testing in Industry

Applying Model-Based Testing in the Telecommunication Domain. Model-Based GUI Testing of Smartphone Applications: Case S60™ and Linux®. Model-Based Testing in Embedded Automotive Systems.

Part VI: Testing at the Lower Levels of Development

Testing-Based Translation Validation of Generated Code. Model-Based Testing of Analog Embedded Systems Components. Dynamic Verification of SystemC Transactional Models.