Reduced Thermal Processing for ULSI
Springer-Verlag New York Inc.
978-1-4612-7857-3 (ISBN)
Rapid Thermal Processing with Reactive Gases.- Rapid Thermal Processing.- Kinetics of Silicon Dielectrics by RTP.- Applications.- Polysilicon Dielectrics.- Rapid Thermal CVD: In-Situ Device Fabrication.- Summary.- Silicidation by Rapid Thermal Processing.- Reactions in the Salicide Process.- Technological Implementation.- Device Implementation of TiSi2 and CoSi2.- Conclusions.- Microstructural Defects in Rapid Thermally Processed IC Materials.- Microstructural Defects in Implanted and Subsequently Rapid Thermally Annealed Silicon Wafers.- Shallow Emitters (for Bipolar Transistors) from Doped Polysilicon Contacts.- Rapid Thermal Oxidation (RTO).- Rapid Thermal Processing of Silicides.- Concluding Remarks.- Rapid Thermal Annealing — Theory and Practice.- Transfer of Energy in Radiant Heating Systems.- Physics of Rapid Thermal Annealers Using Lamp Sources.- Modelling of Rapid Thermal Annealing — Temperature Control.- Modelling of Rapid Thermal Annealing — Temperature Uniformity.- Temperature Measurement.- Emissivity Measurement.- Temperature Non-Uniformity.- Problems and Solutions.- Practical Machine Designs.- Rapid Thermal Process Integration.- CMOS Device Processing.- Device/Circuit Operation Considerations.- Process Interaction Problems.- Process Integration Opportunities with RTP.- Summary.- to Direct Writing of Integrated Circuit.- Laser Pantography Procedure.- Resolution in Laser Pantography.- Laser Induced Temperature.- Laser Wavelength and Laser Power.- Main Difficulties in Laser Direct Writing.- Deposition and Etching Rates.- Process for Silicon Microelectronics.- Laser Induced Chemical Reactions.- Conclusion.- Ion Beam Assisted Processes.- Defect and Collision Cascade.- Ion Beam Assisted Epitaxy Regrowth.- High Current Implant.- Conclusions.-Micrometallization Technologies.- Metallization Techniques.- Ohmic Contacts.- Gate Contacts.- Barrier Layers.- Interconnections.- Multilevel Interconnect Structures.- Metal Conductor Generation.- Intermetal Insulation and Step Coverage.- Topographical Effects.- Possible Solutions to Multilevel Interconnect Problems.- Speculation on Future Multilevel Interconnect.- Interlevel Dielectrics for Reduced Thermal Processing.- Pre-Metal Planarization Process.- Requirements.- Deposition Process.- Optimization of the Flow Step.- Film Analysis.- Other Methods Involving Oxides.- Multilevel-Metal (MLM) Concepts.- Deposited Layers for MLM.- Planarization Concepts.- Depositions Incorporating In-Situ Etchback.- Conclusion.- Low Temperature Silicon Epitaxy for Novel Device Structures.- Low Temperature Epitaxy.- Auto doping, Transition Width and Dopant Incorporation/Reincorporation.- Buried Layer Pattern Transmittance.- Selective Epitaxial Growth.- Conclusion.- Participants.
Reihe/Serie | NATO Science Series: B ; 207 |
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Zusatzinfo | 450 p. |
Verlagsort | New York, NY |
Sprache | englisch |
Maße | 170 x 244 mm |
Themenwelt | Mathematik / Informatik ► Informatik ► Theorie / Studium |
Naturwissenschaften ► Chemie ► Analytische Chemie | |
Naturwissenschaften ► Geowissenschaften ► Mineralogie / Paläontologie | |
Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik | |
Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik | |
Naturwissenschaften ► Physik / Astronomie ► Thermodynamik | |
Technik ► Maschinenbau | |
ISBN-10 | 1-4612-7857-0 / 1461278570 |
ISBN-13 | 978-1-4612-7857-3 / 9781461278573 |
Zustand | Neuware |
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