EMC 2008
Springer Berlin (Verlag)
978-3-540-85154-7 (ISBN)
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
TEM and STEM Instrumentation and Electron Optics.- TEM and STEM Method.- SEM/FIB Instrumentation and Methods.- Other Microscopies.- Image Analysis and Processing.- Sample Preparation for Materials Science and Biology. Instrumentation and Methods.- TEM and STEM instrumentation and Electron Optics.- TEM and STEM methods.- SEM/FIB Instrumentation and Methods.- Other Microscopies.- Image analysis and Processing.- Sample Preparation for Materials Science and Biology.
| Erscheint lt. Verlag | 26.8.2008 |
|---|---|
| Zusatzinfo | XXXVIII, 862 p. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 1496 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Allgemeines / Lexika |
| Schlagworte | Calculus • electron • electron microscopy • Electron optics • Microscopy • Optics • Scanning Electron Microscopy |
| ISBN-10 | 3-540-85154-2 / 3540851542 |
| ISBN-13 | 978-3-540-85154-7 / 9783540851547 |
| Zustand | Neuware |
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