EMC 2008 (eBook)

Preface Volume 1: Instrumentation and Methods 5
Content 7
Aberration corrected STEM and EELS: Atomic scale chemical mapping 39
An update on the TEAM project - first results from the TEAM 0.5 microscope, and its future development 41
Synchrotron based X-ray Microscopy: state of the art and applications 43
High-resolution spectro-microscopy with low-voltage electrons and double aberration correction 45
Developments of aberration correction systems for current and future requirements 47
STEM Aberration Correction: an Integrated Approach 49
Applications of aberration-corrected TEM-STEM and high- resolution EELS for the study of functional materials 51
Aberration corrected TEM and STEM for dynamic in situ experiments 53
HREM study of the SrTiO3 S3 (112) grain boundary 55
A Method to Measure Source Size in Aberration Corrected Electron Microscopes 57
Determining resolution in the transmission electron microscope: object- defined resolution below 0.5Å 59
Direct measurement of aberrations by convergent-beam electron holography ( CHEF) 61
Atomic Structure of BiFeO3-BiCrO3 film on ( 111) SrTiO3 Grown by Dual Cross Beam Pulsed Laser Deposition 63
Demonstration of CC/CS- correction in HRTEM 65
New electron diffraction technique using Cs-corrected annular LACDIF: comparison with electron precession 67
The newly installed aberration corrected dedicated STEM ( Hitachi HD2700C) at Brookhaven National Laboratory 69
Uranium single atom imaging and EELS mapping using aberration corrected STEM and LN2 cold stage 71
Sub-Ångstrøm Low-Voltage Electron Microscopy – future reality for deciphering the structure of beam- sensitive nanoobjects? 73
Detecting and resolving individual adatoms, vacancies, and their dynamics on graphene membranes 75
Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope 77
Design of apochromatic TEM composed of usual round lenses 79
Back-Scattered Electron microscopy in Aberration corrected Electron microscope 81
Structure determination of H-encapsulating clathrate compounds in aberration- corrected STEM 83
Performance of R005 Microscope and Aberration Correction System 85
Optimum operation of Schottky electron sources: brightness, energy spread and stability 87
The MANDOLINE filter and its performance 89
Using a monochromator to improve the resolution in focal- series reconstructed TEM down to 0.5Å 91
First performance measurements and application results of a new high brightness Schottky field emitter for HR- S/ TEM at 80- 300kV acceleration voltage 93
Image Information transfer through a post-column energy filter detected by a lens- coupled CCD camera 95
Third-rank computation of electron and ion optical systems with several and rotated Wien filters 97
Wavelength dispersive soft X-ray emission spectroscopy attached to TEM using multi- capirary X- ray lens 99
Miniature electrostatic-magnetostatic column for electrons 101
Comparison of monochromated electron energy-loss with X- ray absorption near- edge spectra: ELNES vs. XANES 103
A hybrid electron energy loss spectrometer with simultaneous serial and parallel detection 105
In-focus phase contrast: Present state and future developments 107
The Detective Quantum Efficiency of Electron Area Detectors 109
Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector 111
High speed simultaneous X-ray and electron imaging and spectroscopy at synchrotrons and TEMs 113
The image intensity in Zernike mode with electrons 115
Application of a Hilbert phase plate in transmission electron microscopy of materials science samples 117
Optimal Imaging Parameters in Cs-Corrected Transmission Electron Microscopy with a Physical Phase Plate 119
Electron optical design of the Phase Aberration Corrected Electron Microscope 121
Direct electron detectors for TEM 123
A Newly Developed 64 MegaPixel camera for Transmission Electron Microscopy 125
Characterization of a fiber-optically coupled 8k CCD/ CMOS device 127
Direct Single-Electron Imaging using a pnCCD Detector 129
Quantitative TEM and STEM Simulations 131
Quantitative determination of the chemical composition of an alloy by High Angle Annular Dark Field imaging 133
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data 135
First time quantification of the HRTEM information-limit reveals insufficiency of the Young’s- fringe test 137
Quantitative Investigations of the Depth of Field in a Corrected High Resolution Transmission Electron Microscope 139
Quantitative characterisation of surfaces on bi-metallic Pt nanoparticles using combined exit wave restoration and aberration- corrected TEM 141
An HAADF investigation of AlAs-GaAs interfaces using SuperSTEM 143
Spatial Coherence and the Quantitative Interpretation of Atomic Resolution Images 145
Analysis of HRTEM diffractograms from amorphous materials: a simple and minor ( but not explained so far?) question revisited 147
HAADF-STEM image simulation of large scale nanostructures 149
Aberration-corrected HRTEM study of incommensurate misfit layer compound interfaces 151
Influence of atomic displacements due to elastic strain in HAADF- STEM simulated images 153
Effects of electron channeling in HAADF intensity 155
Analysis of the mechanism of N incorporation in N- doped GaAs quantum wells 157
Coherence of high-angle scattered phonon loss electrons and their relevance to TEM and STEM ADF Stobbs Factors 159
Strain measurements in electronic devices by aberrationcorrected HRTEM and dark- field holography 161
PPA: An Improved Implementation of Peak Pairs procedure as a DM plug- in for Strain Mapping 163
Domain structure in Delithiated LiFePO4, a cathode material for Li ion Battery Applications 165
New Approach to Quantitative ADF STEM 167
Reconstruction of the projected crystal potential in high- resolution transmission electron microscopy 169
Three-dimensional atomic-scale structure of size- selected nanoclusters on surfaces 171
Direct retrieval of a complex wave from its diffraction pattern 173
HRTEM evaluation of iron in acid treated ground vermiculite from Santa Olalla ( Huelva, Spain) 175
Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy 177
Quantitative local strain analysis of Si/SiGe heterostructures using HRTEM 179
Displacement field analysis around hydrogen implantation induced platelets ( HIPs) in semi- conductors 181
Thickness effects in Tilted Sample Annular Dark Field Scanning Transmission Electron Microscopy 183
A novel emission potential multislice method to calculate intensity contributions for thermal diffuse scattering in plane wave illumination TEM 185
Three-dimensional HREM Structure Retrieval 187
Description of electron microscope image details based on structure relaxations with enhanced interaction potentials 189
Computation and parametrization of Debye-Waller temperature factors for sphalerite type II- VI, III- V and group IV semiconductors 191
Structural Investigation of Amorphous/Crystalline Interfaces by Iterative Digital Image Series Matching 193
Novel carbon nanosheets as support foils for ultrahigh resolution TEM studies of nanoobjects 195
Quantitative HRTEM studies of reconstructed exit-plane waves retrieved from CS-corrected electron microscopes 197
Geometrical phase analysis of the 1:1 cation ordered domains in complex perovskite ferroelectrics 199
The Stobbs factor in HRTEM: Hunt for a phantom? 201
Measuring coherence in an electron beam for imaging 203
Argand plot: a sensitive fingerprint for electron channelling 205
Atomic-resolution studies of In2O3–ZnO compounds on aberration-corrected electron microscopes 207
Advances in automated diffraction tomography 209
Identification/ fingerprinting of nanocrystals by precession electron diffraction 211
On the Origin and Asymmetry of High Order Laue Zone Lines Splitting in Convergent Beam Electron Diffraction 213
Precession electron diffraction: application to organic crystals and hybrid inorganic- organic materials 215
Structural studies of amorphous materials using RDF, RMC and DFT refinement 217
A Nanoprobe Electron Diffraction Study of Surface Phases in LiCoO2 219
Structural features of RF magnetron sputter deposited Al- Fe and Al- Cu thin films 221
Structural Investigation of a Layered Carbon Nitride Polymer by Electron Diffraction 223
Measuring the particle density of a nanocrystal deposit using DF images and a reciprocal space analysis 225
Towards a quantitative understanding of precession electron diffraction 227
Electron crystallography by quantitative CHEF 229
Precession Electron Diffraction for the characterization of twinning in pseudo- symmetrical crystals: case of coesite 231
Electron precession characterization of pseudo-merohedral twins in the LaGaO3 perovskite 233
Kikuchi electron double diffraction 235
The structure of the complex oxide PbMnO2.75 solved by precession electron diffraction 237
Software Precession Electron Diffraction 239
A new method for electron diffraction based analysis of phase fractions and texture in thin films of metallic nano- crystals 241
Local structures of metallic glasses studied by experimental RDF and model refinement 243
Three groups of hexagonal phases and their relation to the i- phase in Zn- Mg- RE alloy 245
Diffraction analysis of incommensurate modulation in “chain-ladder” composite crystal (Sr/Ca)14Cu24O41 247
Contribution of electron precession to the study of crystals displaying small symmetry departures 249
The symmetry of microdiffraction electron precession patterns 251
Measurement of GaAs structure factors from the diffraction of parallel and convergent electron nanoprobes 253
Differential Electron Diffraction 255
Atomic Structure Determination by “Observing” Structural Phase in 3- Beam CBED Patterns. 257
Automatic space group determination using precession electron diffraction patterns 259
Compositional dependence of the (200) electron diffraction in dilute III- V semiconductor solid solutions 261
Investigation of the local crystal lattice parameters in SiGe nanostructures by convergent- beam electron diffraction analysis 263
Computer simulation of electron nanodiffraction from polycrystalline materials 265
An analytical approach of the HOLZ lines splitting on relaxed samples 267
ELDISCA C# – a new version of the program for identifying electron diffraction patterns 269
Mixing Real and Reciprocal Space 271
Structure solution of intermediate tin oxide, SnO2- by electron precession 273
"Phase-scrambling" multislice simulations of precession electron diffraction 275
High-Resolution Electron Holography on Ferroelectrics 277
Imaging parameters for optimized noise properties in high- resolution off- axis holograms in a Cs- corrected TEM 279
Partial coherence in inelastic holography 281
FIB prepared and Tripod polished prepared p-n junction specimens examined by off-axis electron holography 283
Modelling kink vortices in high-Tc superconductors 285
Off-axis electron holography of FIB-prepared semiconductor specimens with mV sensitivity. 287
Off-axis electron holography and the FIB, a systematic study of the artefacts observed in semiconductor specimens. 289
Analytical TEM and electron holography of magnetic field distribution in nanocrystalline Co layers deposited on Cu 291
Electron Holography with Cs-corrected Tecnai F20 – elimination of the incoherent damping introduced by the biprism in conventional electron microscopes 293
Can the discontinuity in the polarity of the oxide layers at the interface SrTiO3- LaAlO3 be resolved by using Electron Holography with Cs- corrected TEM? 295
Energy-filtered DBI/H 297
Strain determination by dark-field electron holography 299
Nonlinear Electron Inline Holography 301
Electron Holography: Performance and performance limits 303
Reconstruction methods for in- line electron holography of nanoparticles 305
Electron holography of soot nanoparticles 307
Holographic tomography of electrostatic potentials in semiconductor devices 309
Electron Holography on the charge modulated structure In2O3(ZnO)m in comparison with DFT-calculations 311
Correction of the object wave using iteratively reconstructed local object tilt and thickness 313
Extended field of view for medium resolution electron holography at Philips CM 200 Microscope 315
Electron holography of biological and organic objects 317
Magnetic configurations of isolated and assemblies of iron 30 nm nanocubes studied by electron holography 319
Electron holography study of ferroelectric solid solutions 321
Digital holographic interference microscopy of phase microscopic objects investigation 323
Reconstruction of 3D (Ge,Si) islands by 2D phase mapping 325
Quantitative electron tomography of biological structures using elastic and inelastic scattering 327
Discrete tomography in materials science: less is more? 329
Towards atomic-scale bright-field electron tomography for the study of fullerene- like nanostructures 331
DART explained: how to carry out a discrete tomography reconstruction 333
Optical depth sectioning of metallic nanoparticles in the aberration- corrected scanning transmission electron microscope 335
3D-Geometrical and chemical quantification of Au@ SiOx nano- composites in HAADF- STEM imaging mode 337
Electron tomography of mesostructured cellular foam silica 339
A Study of Stacked Si Nanowire Devices by Electron Tomography 341
Simulation of the electron radiation damage in an amorphous Ge sample 343
Observation of Three-dimensional Elemental Distribution by using EF- TEM Tomography 345
HAADF-TEM Tomography of the precipitation state in an Al- Zn- Mg alloy 347
STEM electron tomography of gold nanostructures 349
Three-dimensional imaging of semiconductor nanostructures by compositional- sensitive diffraction contrast electron tomography studies 351
A full tilt range goniometer inside a TEM goniometer 353
Four-dimensional STEM-EELS Tomography 355
Embedment-free section electron microscopy (EM): a highly potential advantage in application to EM tomography 357
Quantification and Segmentation of Electron Tomography Data – Exemplified at ErSi2 Nanocrystals in SiC 359
3-D TEM observation of xenon nano-precipitates in aluminium crystals 361
Dark-field TEM tomography of ordered domain morphology in a Ni4Mo alloy 363
Optimum optical condition of Tomography for thick samples 365
3-dimensional nanoparticle analysis using electron tomography 367
Electron Tomography of ZnO Nanocones with Secondary Signals in TEM 369
Quantification of Nanoparticle Tomograms 371
Tomographic imaging ultra-thick specimens with nanometer resolution 373
Three-dimensional imaging at the mesoscopic scale using STEM- in- SEM 375
Three-dimensional potential mapping of nanostructures with electron- holographic tomography 377
Design of high-speed tomography with the 3MV ultrahigh voltage electron microscope 379
The point spread function assessment of MeV electron imaging quality for thick specimens 381
Relevance of the minimum projection number to specimen structures for high- quality electron tomography 383
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration- Corrected Microscopy 385
EMCD with nm Resolution and Below: Experiments, Proposals, and a Paradox 387
Combining electronic and optical spectroscopy at the nanometer scale in a STEM 389
Deconvolution of core loss electron energy loss spectra 391
Obtaining the loss function from angle resolved electron energy loss spectra 393
Revisiting the determination of carbon sp2/sp3 ratios via analysis of the EELS carbon K- edge 395
Orbital and spin sum rules for electron energy loss magnetic chiral dichroism: Application to metals and oxides 397
Probing bright and dark surface plasmon modes in individual and coupled Au nanoparticles using a fast electron beam 399
Dual energy range EELS spectrum imaging using a fast beam switch 401
Determination of local composition of Li-Si alloys by Electron Energy- Loss Spectroscopy 403
Elemental and bond mapping of complex nanostructures by MLS analysis of EELS spectrum- imaging data 405
EELS analysis of plasmon resonance in the UV-vis energy range of metal alloy nanoparticles 407
Anisotropic effects in ELNES of the O-K edge in rutile: a case of trichroism 409
Dissimilar cation migration in (001) and (110) La2/3Ca1/3MnO3 thin films 411
Energy-loss near edge structures of Cr2O3, CrO2 and YCrO4 phases 413
Distortion corrections of ESI data cubes for magnetic studies 415
Optimisation of the Positions and the Width of the Energy Windows for the Recording of EFTEM Elemental Maps 417
Band gap mapping using monochromated electrons 419
StripeSTEM, a new method for the isochronous acquisition of HAADF images and monolayer resolved EELS 421
Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe ( TAP) through Measurements of Thin Multilayers 423
Development of a Process for Cleaning a TEM Column by Chemical Etching of Oxygen Radicals 425
Low loss EELS study of gold nanoparticles using a monochromated TEM 427
Analytical RPA response of Carbon and BN single-walled nanotubes: Application to EELS and wave loss spectra 429
Improvement of energy resolution of VEELS spectra with deconvolution method for electronic and optical properties analysis on ferroelectric oxides in nano- scale 431
Low Loss Electron Energy Spectroscopy on LiFePO4 for Li ion Battery Applications 433
Atomic-resolution studies of complex oxide materials using in- situ scanning transmission electron microscopy 435
Low-loss EELS measurements on an oxide multilayer system using monochrome electrons 437
White noise subtraction for calculating the two-particlestructure factor from inelastic diffractograms 439
Local Analysis of BaTiO3/SrTiO3 interfaces by STEM- EELS 441
Experimental conditions and data evaluation for quantitative EMCD measurements in the TEM 443
Investigation of the valency distribution in Cu1.2Mn1.8O4 using quantitative EELS near- edge structures analysis 445
EELS mapping of surface plasmons in star-shaped gold nanoparticles: morphological behaviour of optical properties from star to sphere 447
Fast local determination of phases in LixFePO4 449
EELS/EFTEM in life science: proof of the presence of H2O2 in human skin by Ce deposition in melanosomes 451
Phase separation study of annealed SiOx films through energy filtered scanning transmission electron microscope 453
Phase Identification of Aluminium Oxide Phases by Analysis of the Electron Energy- loss Near Edge Structure 455
Valence sensitivity of Fe- L2,3 white- line ratios extracted from EELS 457
Calculation of inelastic scattering events within second order QED – Implications of fully relativistic scattering 459
Role of asymmetries for EMCD sum rules 461
Smart acquisition EELS 463
EELS fine structure tomography using spectrum imaging 465
Shift in electron energy loss compared for different nickel silicides in a Pt alloyed thin film 467
Distribution of Fe and In dopants in ZnO: A combined EELS/ EDS analysis 469
Changes in the Soot Microstructure during Combustion studied by SEM, TEM, Raman and EELS 471
EELS and EFTEM-investigations of aluminum alloy 6016 concerning the elements Al, Si and Mg 473
EELS modelling using a pseudopotential DFT code 475
The EELS spectrum database 477
STEM-EELS analysis of interface magnetic moments in Fe( 100)/ Co( bcc) superlattices 479
EMCD at high spatial resolution: comparison of STEM with EELS profiling 481
Elemental, Chemical and Physical State Mapping in Three- Dimensions using EELS- SI Tomography 483
Sub-0.5 eV EFTEM Mapping using the Zeiss SESAM 485
Acquisition of the EELS data cube by tomographic spectroscopic imaging 487
A low electron fluence EELS study of Fe-coordination within ferrihydrite and phosphorous doped ferrihydrite nanoparticles 489
Optimal aperture sizes and positions for EMCD experiments 491
Chemical analysis of nickel silicides with high spatial resolution by combined EDS and EELS ( ELNES) 493
Retrieving dielectric function by VEELS 495
Some Recent Materials Applications of In Situ High Resolution Electron Microscopy 497
Melting and solidification of alloys embedded in a matrix at nanoscale 499
Advances in transmission electron microscopy: in situ nanoindentation and in situ straining experiments 501
Observing Nanosecond Phenomena at the Nanoscale with the Dynamic Transmission Electron Microscope 503
TEM characterization of nanostructures formed from SiGeO films: effect of electron beam irradiation 505
In situ Lorentz microscopy in an alternating current magnetic field 507
In-situ transmission electron microscopy investigation of TiO islands nucleating on SrTiO3 ( 100) and ( 110) surfaces at high temperature 509
Probing integration strength of colloidal spheres self- assembled from TiO2 nanocrystals by in- situ TEM indentation 511
Installation and operation of an in situ electron microscopy facility 513
Bringing chemical reactions to life: environmental transmission electron microscopy ( E- TEM) 515
Dynamic in situ experiments in a 1Å double aberration corrected environment 517
A very high temperature (2000ºC) stage for atomic resolution in situ ETEM 519
Environmental High Resolution Electron Microscopy With a Closed Ecell: Application to Catalysts 521
Pulsed-mode photon and electron microscopy surveyed 523
In-situ Observation of Nano-particulate Gold Catalysts during Reaction by Closed- type Environmental- cell Transmission Electron Microscope 525
In situ transmission electron microscopy on leadzirconate-titanate under electrical field 527
Elongation of Atomic-size Wires: Atomistic Aspects and Quantum Conductance Studies 529
Atomic-size Silver Nanotube 531
In-situ TEM mechanical testing of a Si MEMS nanobridge 533
In-situ TEM nanoindentation and deformation of Si- nanoparticle clusters 535
Electron Holography of in-situ ferroelectric polarisation switching 537
Development of fast CCD Cameras for in-situ Electron Microscopy 539
In situ characterization of the mechanical properties of nanoparticles and nanoscale structures 541
In-situ engineering of nanostructures with near atomic precision and property measurements 543
In-situ TEM investigation of the contrast of nanocrystals embedded in an amorphous matrix 545
In situ HRTEM – Image corrected and monochromated Titan equipped with environmental cell 547
The surface dynamics of the transient oxidation stages of Cu and Cu binary alloys 549
In-situ TEM for altering nanostructures and recording the changes at an atomic resolution 551
Aberration correction in SEM: Relaunching an old project 553
Changes and reversals of contrasts in SEM 555
Surface potential and SE detection in the SEM 557
On the Spatial Resolution and Nanoscale Features Visibility in Scanning Electron Microscopy and Low- Energy Scanning Transmission Electron Microscopy. 559
Scanning electron microscopy techniques for cross- sectional analyses of thin- film solar cells 561
Maximising EBSD acquisition speed and indexing rate 563
Helium ion microscope: advanced contrast mechanisms for imaging and analysis of nanomaterials 565
Hygroscopic properties of individual aerosol particles from aluminum smelter potrooms determined by environmental scanning electron microscopy 567
Analysis of individual aerosol particles by automated scanning electron microscopy 569
A new quantitative height standard for the routine calibration of a 4- quadrant- large- angles- BSE- detector 571
SEM-EDS for effective surface science and as a next generation defect review tool for nanoparticle analysis? 573
Detection of Signal Electrons by Segmental Ionization Detector 575
Low-voltage Scanning Transmission Electron Microscopy of InGaAs nanowires. 577
Secondary Electrons Characterization of Hydrogenated Dilute Nitrides 579
Mapping of the local density of states with very slow electrons in SEM 581
Thickness and composition measurement of thin TEM samples with EPMA and the thin film analysis software STRATAGem 583
Automatic acquisition of large amounts of 3D data at the ultrastructural level, using serial block face scanning electron microscopy 585
MCSEM- a modular Monte Carlo simulation program for various applications in SEM metrology and SEM photogrammetry 587
Wien filter electron optical characteristics determining using shadow projection method 589
Strain related Contrast mechanisms in crystalline materials imaged with AsB detection 591
Low Loss BSE imaging with the EsB Detection system on the Gemini Ultra FE- SEM 593
Accurate calculations of thermionic electron gun properties 595
Scintillation SE Detector for Variable Pressure Scanning Electron Microscope 597
The stability of retained austenite in supermartensitic stainless steel ( SMSS) examined by means of SEM/ EBSD 599
In-situ EBSD studies of hydrogen induced stress cracking ( HISC) in pipelines of super- duplex stainless steel 601
E-beam hardening SEM glue for fixation of small objects in the SEM 603
Development of the charging reduction system by electron beam irradiation for scanning electron microscopes 605
Aberrations of the cathode lens combined with a focusing magnetic/ immersion- magnetic lens 607
Identification possibilities of micro/nanoparticles and nanocomposites in forensic practice 609
Mass thickness determination of thin specimens using high- resolution scanning electron microscopy 611
Benefits of Low Vacuum SEM for EBSD Applications 613
In-situ combination of SEMPA, STM, and FIB for magnetic imaging and nanoscale structuring 615
Characterisation of the subgrain structure of the aluminium alloy AA6082 after homogenization and hot forming by EBSD 617
An improved detection system for low energy Scanning Transmission Electron Microscopy 619
Thickness determination of thin samples by transmission measurements in a scanning electron microscope 621
Role of the high-angle BSE in SEM imaging 623
Experimental and simulated signal amplification in variable pressure SEM 625
Study of highly-aggressive samples using the variable pressure SEM 627
Characterization of the focusing properties of polycapillary X- ray lenses in the scanning electron microscope 629
Numerical Simulation of Signal Transfer in Scintillator- Photomultiplier Detector 631
Electrical Measurements on Nanostructures in a Scanning Electron Microscope 633
3D Sculptures From SEM Images 635
Influence of tilt of sample on axial beam properties 637
Experimental determination of the total scattering cross section of water vapour and of the effective beam gas path length in a low vacuum scanning electron microscope. 639
Response function of the semiconductor detector of backscattered electrons in SEM 641
Main principles of microtomography using backscattered electrons 643
Considerations of some charging effects on dielectrics by electron beam irradiation 645
The reduction of pileup effects in spectra collected with silicon drift detectors 647
High-temperature oxidation of steel in the ESEM with subsequent scale characterisation by Raman microscopy 649
Method to determine image sharpness and resolution in Scanning Electron Microscopy images 651
Instrumentation of an electron microscope for lithography and analysis of devices over a wide dimensional range 653
Ultra-low energy, high-resolution scanning electron microscopy 655
Non-destructive 3D imaging of the objects internal microstructure by microCT attachment for SEM 657
A novel use of rf-GD sputtering for sample surface preparation for SEM: its impact on surface analysis 659
Development of an ultra-fast EBSD detector system 661
Future prospects on EBSD speeds using a 40 nA FESEM 663
High pressure imaging in the environmental scanning electron microscope ( ESEM) 665
Cathodoluminescence spectrum-imaging in the scanning electron microscope using automated stage control 667
Low voltage, high resolution SEM imaging for mesoporous materials 669
New developments in state of the art silicon drift detectors ( SDD) and multiple element SDD 671
SEM in forensic science 673
Secondary electron imaging due to interface trapped charges for a buried SiO2 microstructure 675
HRSEM Secondary Electron Doping Contrast: Theory based on Band Bending and Electron Affinity Measurements 677
3D EBSD-based orientation microscopy and 3D materials simulation tools: an ideal combination to study microstructure formation processes 679
Capturing Sub-Nanosecond Quenching in DualBeam FIB/ SEM Serial Sectioning. 681
Deformation mechanisms in 1D nanostructures revealed by in situ tensile testing in an SEM/FIB 683
Focused Ion Beam Tomography of Insulating Biological and Geological Materials 685
Redeposition and differential sputtering of La in TEM samples of LaAlO3 / SrTiO3 multilayers prepared by FIB 687
Fabrication and characterization of highly reproducible, high resistance nanogaps made by focused ion beam milling 689
TEM sample preparation on photoresist 691
Advanced FIB preparation of semiconductor specimens for examination by off- axis electron holography. 693
Comparison of ion- and electron-beam-induced Pt nanodeposits: composition, volume per dose, microstructure, and in- situ resistance 695
In-line FIB TEM sample preparation induced effects on advanced fully depleted silicon on insulator transistors 697
The development of cryo–FIBSEM techniques for the sectioning and TEM analysis of the cell- biomaterial interface. 699
Three-slit interference experiments with electrons 701
Contrast in ion induced secondary electron images 703
Quantitative in situ thickness determination of FIB TEM lamella by using STEM in a SEM 705
Analysis of ion diffusion in multilayer materials by depth profiling in a Crossbeam FIB- SIMS microscope 707
Growth of In2O3 islands on Y- stabilised ZrO2: a study by FIB and HRTEM 709
Carbon nanotubes grown in contact holes for nano electronic applications: how to prepare TEM samples by FIB? 711
Advances in 3-dimensional material characterisation using simultaneous EDS and EBSD analysis in a combined FIB- SEM microscope 713
Investigation of the effects of the TEM specimen preparation method on the analysis of the dielectric gate stack in GaAs based MOSFET devices. 715
Manipulation and contacting of individual carbon nanotubes inside a FIB workstation 717
High volume TEM-sample preparation using a wafer saving in- line preparation tool 719
The influence of beam defocus on volume growth rates for electron beam induced platinum deposition 721
Reducing of ion beam induced surface damaging using “ low voltage” focused ion beam technique for transmission electron microscopy sample preparation 723
DualBeam FIB application of 3D EDXS for superalloy d-phase characterization 725
Time-resolved photoemission electron microscopy 727
Quantitative 3D imaging of cells at 50 nm resolution using soft x- ray tomography 729
STXM-NEXAFS of individual titanate-based nanoribbon 731
The fine structure of bioreactor liver tissue seen through the eyes of X- ray micro- computed tomography 733
Comparing the Si(Li)-detector and the silicon drift detector ( SDD) using EDX in SEM 735
Enhancing contrast of Al traces on Si substrates using low- voltage SEM- hosted XRM 737
An optical demonstration of ptychographical imaging of a single defect in a model crystal 739
HRTEM and STXM, a combined study of an individual focused- ion- beam patterned CNT 741
Compact micro-CT/micro-XRF system for non-destructive 3D analysis of internal chemical composition. 743
NanoCT: Visualising of Internal 3D-Structures with Submicrometer Resolution 745
Dynamics of nanostructures on surfaces revealed by high- resolution, fast- scanning STM 747
Spin mapping on the atomic scale 749
Researching the structure of the surface of undoped ZnO thin films by means of Atomic Force Microscopy 751
Improving the structural characterization of supported on glass gold nanoparticles using Atomic Force Microscopy on vacuum conditions 753
CO and O2 chemisorption on Pd70Au30( 110) : evolution of the surface studied by in situ STM and complementary surface analysis techniques at elevated pressures 755
Height measurements on soft samples: applied force, molecules deformation and phase shift 757
Effect of temperature on phase transition of cardiolipin liquid- crystalline aggregates studied by AFM 759
Investigating the influence of dynamic scattering on ptychographical iterative techniques 761
Determination of the lateral Resolution of a Cantilever based Solid Immersion Lens Near Field Microscope 763
LT-STM manipulation and spectroscopy of single copper and cobalt atoms 765
3D atomic-scale chemical analysis of engineering alloys 767
New Applications for Atom-Probe Tomography in Metals, Semiconductors and Ceramics 769
Pulsed laser atom probe tomography analysis of advanced semiconductor nanostructures 771
Low Energy Electron Microscopy: A 10 Year Outlook 773
Imaging of Surface Plasmon Waves in Nonlinear Photoemission Microscopy 775
High resolution surface analysis of metallic and biological specimens by NanoSIMS 777
Elemental distribution profiles across Cu(In,Ga) Se2 solar- cell absorbers acquired by various techniques 779
High resolution Kelvin force microscopy 781
High resolution in interferometric microscopy 783
Effects of annealing on the microstructural evolution of copper films using texture analysis 785
Characterisation of Ga-distribution on a silicon wafer after inline FIB- preparation using inline ToFSIMS 787
First results in thin film analysis based on a new EDS software to determine composition and/ or thickness of thin layers on substrates 789
Calibration of RHEED patterns for the appraisal of titania surface crystallography 791
Surface orientation dependent termination and work- function of in situ annealed strontium titanate 793
Structure determination of zeolites by electron crystallography 795
3D electron diffraction of protein crystals: data collection, cell determination and indexing 797
Self-assembly of cholesterol-based nonionic surfactants in water. Unusual micellar structure and transitions 799
Quantitative study of anode microstructure related to SOFC stack degradation 801
New considerations for exit wavefunction restoration under aberration corrected conditions. 803
High quality electron diffraction data by precession 805
Optimal noise filters for high-resolution electron microscopy of non- ideal crystals 807
Noise considerations in the application of the transport of intensity equation for phase recovery 809
elmiX – An Electron Microscopy Software Collection for Data Analysis and Education 811
Speed considerations when performing particle analysis and chemical classification by SEM/ EDS 813
Morphological characterization of particles with very broad size distributions using program MDIST 815
Multiple protein structures in one shot: maximum- likelihood image classification in 3D-EM 817
Compensation and evaluation of errors of 3D reconstructions from confocal microscopic images 819
High content image-based cytometry as a tool for nuclear fingerprinting 821
Measurement of surface area of biological structures, based on 3D microscopic image data 823
The imaging function for tilted samples: simulation, image analysis and correction strategies 825
4D-Microscopy 827
Strategies for high content imaging screening and analysis of primary neurons 829
Modelling and analysis of clustering and colocalization patterns in ultrastructural immunogold labelling of cell compartments based on 3- D image data 831
Modern Methods of TEM Specimen Preparation in Material Science 833
Ultramicrotomy in biology and materials science: an overview 835
Preparation of Biological Samples for Electron Microscopy 837
Web sample preparation guide for transmission electron microscopy (TEM) 839
Novel carbon nanosheets as support for ultrahigh resolution structural analysis of nanoparticles 841
A new automated plunger for cryopreparation of proteins in defined - even oxygen free - atmospheres 843
A novel method for precipitates preparation using extraction replicas combined with focused ion beam techniques 845
An appraisal of FIBSEM and ultramicrotomy for the TEM analysis of the cell- biomaterial interface 847
Observation of the structure of aqueous polymers with cryo- SEM 849
Lipid nanotube encapsulating method in low voltage scanning transmission electron microscopy 851
Microscopy observation of food biopolymers and related sample preparation methods 853
Preparation of SiC/SiC thin foils for TEM observations by wedge polishing method 855
Serial-section Polishing Tomography 857
Visualization of detergent resistant membrane rafts in human colorectal cancer cells with correlative confocal and transmission electron microscopy 859
Contribution of low tension ion-milling to heterostructural semiconductors preparation 861
Metallographic characterization of MgH2- Mg system 863
LSM tomography of 2-cell mouse embryo 865
Microwave-assisted sample preparation for life science 867
Comparison TEM specimen preparation of perovskite thin films by conventional Ar ion milling and tripod polishing 869
In-situ temperature measurements on TEM-specimen during ion-milling 871
Author Index 873
Subject Index 889