EMC 2008

Vol 1: Instrumentation and Methods

Martina Luysberg, Karsten Tillmann, Thomas Weirich (Herausgeber)

Buch | Softcover

XXXVIII, 862 Seiten

2016
Springer Berlin (Verlag)
978-3-662-50225-9 (ISBN)

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14th European Microscopy Congress 1-5 September 2008, Aachen, Germany

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.

Instrumentation and Methods.- TEM and STEM instrumentation and Electron Optics.- TEM and STEM methods.- SEM/FIB Instrumentation and Methods.- Other Microscopies.- Image analysis and Processing.- Sample Preparation for Materials Science and Biology.

Erscheinungsdatum	01.07.2016
Zusatzinfo	XXXVIII, 862 p.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	1359 g
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Allgemeines / Lexika
Schlagworte	Calculus • electron • electron microscopy • Electron optics • Microscopy • Optics • Scanning Electron Microscopy
ISBN-10	3-662-50225-9 / 3662502259
ISBN-13	978-3-662-50225-9 / 9783662502259
Zustand	Neuware