Contactless VLSI Measurement and Testing Techniques
Springer International Publishing (Verlag)
978-3-319-69672-0 (ISBN)
Dr. Selahattin Sayil is a Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University. His research focuses on VLSI Testing, Contactless Testing, Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.
1. Conventional Test Methods. - 2. Testability Design.- 3. Other Techniques Based on the Contacting Probe.- 4. Contactless Testing.- 5. Electron-Beam and Photoemission Probing.- 6. Electro Optic Sampling and Charge Density Probe.- 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe.- 8. Probing Techniques Based on Light Emission from Chip.- 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits.- 10. Comparison of Contactless Testing Methodologies.
Erscheinungsdatum | 28.12.2017 |
---|---|
Zusatzinfo | V, 93 p. 34 illus., 11 illus. in color. |
Verlagsort | Cham |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 297 g |
Themenwelt | Mathematik / Informatik ► Informatik ► Theorie / Studium |
Technik ► Elektrotechnik / Energietechnik | |
Schlagworte | Contactless Testing • Integrated Circuit Reliability • Integrated Circuit Test Engineering • VLSI Design For Testability • VLSI Test Principles and Architectures |
ISBN-10 | 3-319-69672-6 / 3319696726 |
ISBN-13 | 978-3-319-69672-0 / 9783319696720 |
Zustand | Neuware |
Haben Sie eine Frage zum Produkt? |
aus dem Bereich