Soft Error Mechanisms, Modeling and Mitigation

Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University.  His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.

Introduction.- Mitigation of Single Event Effects.- Transmission Gate (TG) Based Soft Error Mitigation Methods.- Single Event Soft Error Mechanisms.- Modeling Single Event Crosstalk Noise in Nanometer Technologies.- Modeling of Single Event Coupling Delay and Speedup Effects.- Single Event Upset Hardening of Interconnects.- Soft-Error Aware Power Optimization.- Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.

"Book gives wide perspectives on the technical insights of fundamentals of sources and mitigation strategies of soft error rates in semiconductor memory devices ... . a valuable addition to a scientific library, as well as served as good introduction for memory reliability engineers or specialists and   industrials involved in the field of memory device reliability. This book is highly recommended for people who desire a better understanding of the theory and practice of SER and technical considerations in SER mitigations." (Chong Leong Gan, Microelectronics Reliability, Vol. 74 (81), 2017)