Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Buch | Hardcover
380 Seiten
2013
Academic Press Inc (Verlag)
978-0-12-407702-7 (ISBN)
209,95 inkl. MwSt
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Image Segmentation in the ?eld of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classi?cation Techniques
Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka, and Maxime Carre

Representations for Morphological Image Operators and Analogies with Linear Operators
Petros Maragos

Electron Microscopy at Cambridge University with Charles Oatley and Ellis Cosslett: Some Reminiscences and Recollections.
Kenneth C.A. Smith

Advanced Methods of Electron Microscopy in Catalysis ResearchMiguel Jose-Yacaman, Arturo Ponce, Sergio Mejia-Rosales, and Francis Leonard Deepak

Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 700 g
Themenwelt Mathematik / Informatik Informatik Theorie / Studium
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Technik Elektrotechnik / Energietechnik
Technik Maschinenbau
ISBN-10 0-12-407702-1 / 0124077021
ISBN-13 978-0-12-407702-7 / 9780124077027
Zustand Neuware
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