Exploring Scanning Force Microscopes with Mathematica - Dror Sarid

Exploring Scanning Force Microscopes with Mathematica

(Autor)

Buch | Hardcover
262 Seiten
1997
John Wiley & Sons Inc (Verlag)
978-0-471-16818-8 (ISBN)
93,63 inkl. MwSt
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This text and CD-ROM consists of self-contained, interactive, computational examples from the fields of scanning tunnelling microscopy, scanning force microscopy, and related topics using Mathematica notebooks that incorporate the "Tex" typesetting language through the nb2tex programme.
This book/software edition provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. Its self-contained presentation spares researchers the valuable time spent hunting through the technical literature in search of prior theoretical results required to understand the models presented. Mathematica code for all examples is included both in the book and at the accompanying ftp site, affording the freedom to change, at will, the values and parameters of specific problems or even modify the programs themselves to suit various modeling needs. Exploring Scanning Probe Microscopy with Mathematica is both a solid professional reference and an advanced-level text, beginning with scanning probe microscopy basics and moving on to cutting-edge techniques, experiments, and theory. In the section devoted to atomic force microscopy, Dr. Sarid describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics.
This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features chapters covering density of states in arbitrary dimensions, quantum wells and dots, and electrostatics.

DROR SARID is a professor in the Optical Sciences Center, University of Arizona, Tucson. He received his PhD in physics from the Hebrew University in Jerusalem. Dr. Sarid is the author of Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces.

Uniform Cantilevers. Cantilever Conversion Tables. V-Shaped Cantilevers. Tip-Sample Adhesion. Tip-Sample Force Curve. Free Vibrations. Noncontact Mode. Tapping Mode. Metal-Insulator-Metal Tunneling. Fowler-Nordheim Tunneling. Scanning Tunneling Spectroscopy. Coulomb Blockade. Density of States. Electrostatics. Near-Field Optics. Index.

Erscheint lt. Verlag 24.11.1997
Zusatzinfo Illustrations
Verlagsort New York
Sprache englisch
Maße 160 x 242 mm
Gewicht 616 g
Einbandart gebunden
Themenwelt Mathematik / Informatik Informatik Theorie / Studium
Naturwissenschaften
ISBN-10 0-471-16818-1 / 0471168181
ISBN-13 978-0-471-16818-8 / 9780471168188
Zustand Neuware
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