Efficient Test Methodologies for High-Speed Serial Links

Buch | Hardcover
98 Seiten
2009
Springer (Verlag)
978-90-481-3442-7 (ISBN)

Lese- und Medienproben

Efficient Test Methodologies for High-Speed Serial Links - Dongwoo Hong, Kwang-Ting Cheng
144,44 inkl. MwSt
Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.

Erscheint lt. Verlag 7.12.2009
Reihe/Serie Lecture Notes in Electrical Engineering ; 51
Zusatzinfo XII, 98 p.
Verlagsort Dordrecht
Sprache englisch
Maße 155 x 235 mm
Themenwelt Mathematik / Informatik Informatik Theorie / Studium
Informatik Weitere Themen Hardware
Technik Elektrotechnik / Energietechnik
ISBN-10 90-481-3442-0 / 9048134420
ISBN-13 978-90-481-3442-7 / 9789048134427
Zustand Neuware
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