Data Converters, Phase-Locked Loops, and Their Applications

The book covers all the design aspects of digital-to-analog converters, analog-to-digital converters, phase-locked loops, delay-locked loops, high-speed input/output link transceivers, and class D amplifiers. It describes calibration methods that can be used to compensate circuit errors due to device mismatches and semiconductor process variations.

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With a focus on designing and verifying CMOS analog integrated circuits, the book reviews design techniques for mixed-signal building blocks, such as Nyquist and oversampling data converters, and circuits for signal generation, synthesis, and recovery. The text details all aspects, from specifications to the final circuit, of the design of digital-to-analog converters, analog-to-digital converters, phase-locked loops, delay-locked loops, high-speed input/output link transceivers, and class D amplifiers. Special emphasis is put on calibration methods that can be used to compensate circuit errors due to device mismatches and semiconductor process variations.






Gives an overview of data converters, phase- and delay-locked loop architectures,
highlighting basic operation and design trade-offs.



Focus on circuit analysis methods useful to meet requirements for a high-speed and power-efficient operation.



Outlines design challenges of analog integrated circuits using state-of-the-art CMOS processes.



Presents design methodologies to optimize circuit performance on both transistor and architectural levels.



Includes open-ended circuit design case studies.