Industrial X-Ray Computed Tomography -

Industrial X-Ray Computed Tomography

Buch | Hardcover
VII, 369 Seiten
2017 | 1st ed. 2018
Springer International Publishing (Verlag)
978-3-319-59571-9 (ISBN)
171,19 inkl. MwSt

X-ray computed tomography has been used for several decades as a tool for measuring the three-dimensional geometry of the internal organs in medicine. However, in recent years, we have seen a move in manufacturing industries for the use of X-ray computed tomography; first to give qualitative information about the internal geometry and defects in a component, and more recently, as a fully-quantitative technique for dimensional and materials analysis. This trend is primarily due to the ability of X-ray computed tomography to give a high-density and multi-scale representation of both the external and internal geometry of a component, in a non-destructive, non-contact and relatively fast way. But, due to the complexity of X-ray computed tomography, there are remaining metrological issues to solve and the specification standards are still under development. This book will act as a one-stop-shop resource for students and users of X-ray computed tomography in both academia and industry. Itpresents the fundamental principles of the technique, detailed descriptions of the various components (hardware and software), current developments in calibration and performance verification and a wealth of example applications. The book will also highlight where there is still work to do, in the perspective that X-ray computed tomography will be an essential part of Industry 4.0.

Simone Carmignato is Professor of Manufacturing Engineering and Manufacturing Metrology at the University of Padua, Italy. His research activities are in the area of precision engineering and dimensional metrology, with focus on industrial computed tomography and advanced coordinate metrology. In 2012, he was awarded the F. W. Taylor Medal from CIRP, the International Academy for Production Engineering. Wim Dewulf holds a Professorship in the Department of Mechanical Engineering at KU Leuven, Belgium, where he is leading research groups on Sustainable Engineering and on Dimensional Metrology. In the latter field, his major research themes include X-ray computed tomography, multi-sensor metrology, and automated inspection planning. He was, amongst others, coordinating the highly successful INTERAQCT project, which provided an extensive industrial-academic training environment for young researchers in the field of X-ray CT metrology.

Introduction.- Principles of X-ray computed tomography.- Technical concepts and components.- Processing and visualization of CT data.- Computer simulation.- Error sources.- Performance verification.- Traceability of CT dimensional measurements.- CT for non-destructive testing and materials characterization.- CT for dimensional metrology.- Other industrial applications.

Erscheinungsdatum
Zusatzinfo VII, 369 p. 273 illus.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Gewicht 704 g
Themenwelt Technik Maschinenbau
Schlagworte Atomic & molecular physics • Atomic, Molecular, Optical and Plasma Physics • Atomic & molecular physics • Characterization and Evaluation of Materials • Chemistry and Materials Science • CT Dimensional Measurement • CT Scanning Industry • CT System Calibration • Data Processing Workflow • electronic devices & materials • Electronic devices & materials • engineering skills & trades • Engineering skills & trades • Image Artifacts • Manufacturing, Machines, Tools • Materials Science • Measurement Uncertainty Determination • Nondestructive Materials Testing • optical and electronic materials • Reference Objects • Surface Determination • Testing of materials
ISBN-10 3-319-59571-7 / 3319595717
ISBN-13 978-3-319-59571-9 / 9783319595719
Zustand Neuware
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