CMOS Test and Evaluation

A Physical Perspective

Manjul Bhushan, Mark B. Ketchen (Autoren)

Buch | Softcover

424 Seiten

2016 | Softcover reprint of the original 1st ed. 2015
Springer-Verlag New York Inc.
978-1-4939-4702-7 (ISBN)

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CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Manjul Bhushan is a technical consultant in New York. Mark Ketchen is a technical consultant in Massachusetts.

Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.

Erscheinungsdatum	23.09.2016
Zusatzinfo	338 Illustrations, black and white; XIII, 424 p. 338 illus.
Verlagsort	New York
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Technik ► Bauwesen
	Technik ► Elektrotechnik / Energietechnik
	Technik ► Maschinenbau
Schlagworte	CMOS manufacturing test and quality Control • CMOS microelectronic test structures • CMOS products • CMOS statistical data analysis • CMOS test
ISBN-10	1-4939-4702-8 / 1493947028
ISBN-13	978-1-4939-4702-7 / 9781493947027
Zustand	Neuware