Reliability Prediction from Burn-In Data Fit to Reliability Models
Seiten
2014
Academic Press Inc (Verlag)
978-0-12-800747-1 (ISBN)
Academic Press Inc (Verlag)
978-0-12-800747-1 (ISBN)
Helps you educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level.
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design.
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design.
Joseph B. Bernstein is Professor of Electrical Engineering at Ariel University, Ariel, Israel. He received his PhD from MIT, Cambridge, MA, USA, and has previously worked as a Professor at Bar Ilan University, Israel, and at the University of Maryland and the MIT Lincoln Laboratory. He has co-authored two books.
Introduction1. Shortcut to accurate reliability prediction2. M-HTOL Principles3. Failure Mechanisms4. New M-HTOL Approach5. Bibliography
Verlagsort | San Diego |
---|---|
Sprache | englisch |
Maße | 152 x 229 mm |
Gewicht | 90 g |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
ISBN-10 | 0-12-800747-8 / 0128007478 |
ISBN-13 | 978-0-12-800747-1 / 9780128007471 |
Zustand | Neuware |
Haben Sie eine Frage zum Produkt? |
Mehr entdecken
aus dem Bereich
aus dem Bereich
Kolbenmaschinen - Strömungsmaschinen - Kraftwerke
Buch | Hardcover (2023)
Hanser (Verlag)
49,99 €