Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials (eBook)

Index of Keywords; Preface; On the book; Achknowledgements; Photo of the group; List of Authors; Part I – Fundamentals of Functional Materials: Functional Materials, P.M. Vilarinho; Scaling of Silicon-Based Devices to Submicron Dimensions; A.I. Kingon, Unsolved problems in ferroelectrics for scanning probe micrsocopy; J.F. Scott, Part II – Fundamentals of Scanning Probe Techniques: Principles of Basic and Advanced Scanning Probe Microscopy; D.A. Bonnell and R. Shao, Nanoscale probing of physical and chemical functionality with Near-Field Optical Microscopy; L.M. Eng, Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy; Y. Rosenwaks and R. Shikler, Expanding the Capabilities of the Scanning Tunneling Microscope; K.F. Kelly et al, Functions of NC – AFM on atomic scale; S. Morita et al, Part III – Application of Scanning Techniques to Functional Materials: Scanning probe microscopy of piezoelectric and transport phenomena in electroceramic materials; S.V. Kalinin and D.A. Bonnell, SFM-BASED METHODS FOR FERROELECTRIC STUDIES; A. Gruverman, Scanning Tunneling Spectroscopy: LOCAL DENSITY OF STATES AND SPIN DISTRIBUTION OF INTERACTING ELECTRON SYSTEMS; M. Morgenstern,NANOINSPECTION OF DIELECTRIC AND POLARIZATION PROPERTIES AT INNER AND OUTER INTERFACES IN FUNCTIONAL FERROELECTRIC PZT THIN FILMS; L.M. Eng, Microscale Contact Charging On A Silicon Oxide; S. Morita et al, Constructive Nanolithography; S.R. Cohen et al, Nanometer-Scale Electronics and Storage; K.F. Kelly et al, Part IV – Contributed papers: STM tips fabrication for critical dimension measurement; A. Pasquini et al, SCANNING PROBE MICROSCOPY CHARACTERIZATION OF FERROELECTRICS DOMAINS AND DOMAINS WALLS IN KTiOPO4; C. Canalias et al, Imaging local dielectric and mechanical responses with dynamic heterodyned electrostatic force microscopy; D.R. Oliver et al, AFM PATTERNING OFSrTiO3 THIN FILMS AND DEVICE APPLICATIONS; L. Pellegrino, Nanoscale investigation of a Rayleigh Wave on LiNbO3; J. Yang and R. Koch, Scanning Capacitance Force Microscopy and Kelvin probe force microscopy of nanostructures embedded in SiO2; G. Tallarida et al, Electrical characterisation of III-V buried heterostructure lasers by scanning capacitance microscopy; O. Douhéret, Probing the Density of States of High Temperature Superconductors with Point Contact Tunneling Spectroscopy; L. Ozyuzer et al, Annealing influence on Co ultrathin film morphology in MBE grown Co/Au bilayers; A. Wawro et al, Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration; A.Rinkevich et al, SPM INVESTIGATION OF THIOLATED GOLD NANOPARTICLE PATTERNS DEPOSITED ON DIFFERENT SELF-ASSEMBLED SUBSTRATES; F. Sbrana, AFM of guanine adsorbed on HOPG under electrochemical controL; A. M. Chiorcea and A.M. Oliveira Brett, DYNAMICS IN MODEL MEMBRANES AND DNA-MEMBRANE COMPLEXES USING TEMPERATURE CONTROLLED ATOMIC FORCE MICROSCOPY; Z.V. Leonenko and D.T. Cramb, INDEX