Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Springer-Verlag New York Inc.
978-1-4020-3018-5 (ISBN)
Fundamentals of Functional Materials.- Functional Materials: Properties, Processing and Applications.- Scaling of Silicon-Based Devices to Submicron Dimensions.- Unsolved Problems in Ferroelectrics for Scanning Probe Microscopy.- Fundamentals of Scanning Probe Techniques.- Principles of Basic and Advanced Scanning Probe Microscopy.- Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopy.- Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy.- Expanding the Capabilities of the Scanning Tunneling Microscope.- Functions of NC-AFM on Atomic Scale.- Application of Scanning Techniques to Functional Materials.- Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials.- SFM-Based Methods for Ferroelectric Studies.- Scanning Tunneling Spectroscopy.- Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films.- Microscale Contact Charging on a Silicon Oxide.- Constructive Nanolithography.- Nanometer-Scale Electronics and Storage.- Contributed papers.- Stm Tips Fabrication for Critical Dimension Measurements.- Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO4.- Imaging Local Dielectric and Mechanical Responses with Dynamic Heterodyned Electrostatic Force Microscopy.- AFM Patterning of SrTiO3?? Thin Films and Device Applications.- Nanoscale Investigation of a Rayleigh Wave on LiNbO3.- Scanning Capacitance Force Microscopy and Kelvin Probe Force Microscopy of Nanostructures Embedded in SiO2.- Electrical Characterisation of III–V Buried Heterostructure Lasers by Scanning Capacitance Microscopy.- Probing the Density of States of High TemperatureSuperconductors with Point Contact Tunneling Spectroscopy.- Annealing Influence on Co Ultrathin Film Morphology in MBE Grown Co/Au Bilayers.- Correlation between the Surface Relief and Interfaces Structure of Fe/Cr Superlattices and Electromagnetic Waves Penetration.- Magnetoresistance and Microstructure of Magnetic Thin Film Multilayers.- SPM Investigation of Thiolated Gold Nanoparticle Patterns Deposited on Different Self-Assembled Substrates.- AFM of Guanine Adsorbed on HOPG under Electrochemical Control.- Dynamics in Model Membranes and DNA-Membrane Complexes Using Temperature Controlled Atomic Force Microscopy.
Erscheint lt. Verlag | 21.2.2005 |
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Reihe/Serie | NATO Science Series II: Mathematics, Physics and Chemistry ; 186 |
Zusatzinfo | XXXVII, 488 p. |
Verlagsort | New York, NY |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik | |
Naturwissenschaften ► Physik / Astronomie ► Thermodynamik | |
Technik ► Elektrotechnik / Energietechnik | |
Technik ► Maschinenbau | |
ISBN-10 | 1-4020-3018-5 / 1402030185 |
ISBN-13 | 978-1-4020-3018-5 / 9781402030185 |
Zustand | Neuware |
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