Applied Scanning Probe Methods VIII
Springer Berlin (Verlag)
978-3-642-09340-1 (ISBN)
Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971, an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976, respectively, an MBA from Rensselaer Polytechnic Institute at Troy, NY in 1980, Doctor Technicae from the University of Trondheim at Trondheim, Norway in 1990, a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw, Poland in 1996, and Doctor Honoris Causa from the Metal-Polymer Research Institute of National Academy of Sciences at Gomel, Belarus in 2000. He is a registered professional engineer (mechanical) and presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology on the macro- to nanoscales, and is one of the most prolific authors in the field. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology.
Harald Fuchs, Jahrgang 1954 und Vater von drei Kindern, lebt in Pforzheim. Er arbeitete viele Jahre selbstständig in der Werbebranche, bis er sich 2004 umorientierte und unter anderem eine Ausbildung als Elektrobiologe absolvierte. 2008 begann er, sein Wissen auf eigenen Vorträgen und Seminaren an die Menschen weiterzugeben. Technologische sowie gesellschaftliche Entwicklungen und Veränderungen stehen dabei stets im Mittelpunkt seiner Betrachtungen.
Background-Free Apertureless Near-Field Optical Imaging.- Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes.- Near Field Probes: From Optical Fibers to Optical Nanoantennas.- Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging.- Scanning Probes for the Life Sciences.- Self-Sensing Cantilever Sensor for Bioscience.- AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication.- Cantilever Spring-Constant Calibration in Atomic Force Microscopy.- Frequency Modulation Atomic Force Microscopy in Liquids.- Kelvin Probe Force Microscopy: Recent Advances and Applications.- Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale.- Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy.
Erscheint lt. Verlag | 16.11.2010 |
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Reihe/Serie | NanoScience and Technology |
Zusatzinfo | LIX, 465 p. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 789 g |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
Technik ► Maschinenbau | |
Schlagworte | AFM • Carbon Nanotubes • Ceramics • liquid • Material Science • Microscopy • Nanoscience • Nanotube • Pes • Physical Chemistry • Polymer • Surface Science |
ISBN-10 | 3-642-09340-X / 364209340X |
ISBN-13 | 978-3-642-09340-1 / 9783642093401 |
Zustand | Neuware |
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