Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

The Scanning Transmission Electron Microscope
Buch | Hardcover
320 Seiten
2009
Academic Press Inc (Verlag)
978-0-12-374986-4 (ISBN)
219,95 inkl. MwSt
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Features articles on the physics of electron devices, particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in these domains. This book presents several articles on the scanning transmission electron microscope.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

The beginnings and development of the scanning transmission electron microscope (STEM)
Albert V. Crewe
STEM in the life sciences
Andreas Engel
The AEI and Siemens STEM instruments
Peter Hawkes
STEM in Japan
Hiromi Inada
Early work on the STEM
Michael S. Isaacson
The Toulouse high-voltage STEM project
Bernard Jouffrey
Aberration-corrected STEM
Ondrej Krivanek
STEM in Cambridge
K.C.A. Smith
A review of the cold field electron cathode
Lyn Swanson and Greg Schwind
STEM in Oxford and at Vacuum Generators
Sebastian von Harrach
The Vacuum Generators STEM
Ian Wardell and Peter Bovey
Historical background of the STEM at Brookhaven National Laboratory
Joseph Wall

Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 800 g
Themenwelt Naturwissenschaften Physik / Astronomie Angewandte Physik
Technik
ISBN-10 0-12-374986-7 / 0123749867
ISBN-13 978-0-12-374986-4 / 9780123749864
Zustand Neuware
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