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Radiation Effects on Embedded Systems

Raoul Velazco, Pascal Fouillat, Ricardo Reis (Herausgeber)

Buch | Hardcover

269 Seiten

2007
Springer-Verlag New York Inc.
978-1-4020-5645-1 (ISBN)

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Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.

This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.

Radiation Space Environment.- Radiation Effects in Microelectronics.- In-flight Anomalies on Electronic Devices.- Multi-level Fault Effects Evaluation.- Effects of Radiation on Analog and Mixed-Signal Circuits.- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing.- Design Hardening Methodologies for ASICs.- Fault Tolerance in Programmable Circuits.- Automatic Tools for Design Hardening.- Test Facilities for SEE and Dose Testing.- Error Rate Prediction of Digital Architectures: Test Methodology and Tools.- Using the SEEM Software for Laser SET Testing and Analysis.

Zusatzinfo	VIII, 269 p.
Verlagsort	New York, NY
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Informatik ► Theorie / Studium ► Kryptologie
	Naturwissenschaften ► Chemie ► Physikalische Chemie
	Technik ► Elektrotechnik / Energietechnik
ISBN-10	1-4020-5645-1 / 1402056451
ISBN-13	978-1-4020-5645-1 / 9781402056451
Zustand	Neuware