Scanning Probe Microscopy
Springer Berlin (Verlag)
978-3-540-43180-0 (ISBN)
1 Introduction to Scanning Probe Microscopy.- 2 Introduction to Scanning Tunneling Microscopy.- 3 Force Microscopy.- 4 MFM and Related Techniques.- 5 Other Members of the SPM Family.- 6 Artifacts in SPM.- 7 Prospects for SPM.- References.
From the reviews:
"This book provides a nice and clearly written introduction to scanning probe microscopy (SPM) ... . It addresses a large audience that ranges from high school teachers to undergraduates to graduate students and post-docs in physics and biology." (opn - Optics & Photonics News, Vol. 16 (9), 2005)
"In this book, the authors aim to give a general introduction to SPM and highlight some of the many applications of this technique. ... the book succeeds in conveying the wide range of SPM techniques and their applications in an enthusiastic manner. ... it is well referenced and will serve as a good starting point for further studies. However, it will be of most use to researchers and students with a particular interest in SFM and MFM." (Steven R Schofield, The Physicist, Vol. 41 (3), May/June, 2004)
"The book is well written and well laid out, providing a good, logical progression from one subject area to the next. Generally, a good balance between theory and experiment is struck, with an appropriate number of quite beautiful images. ... References are plentiful and appropriate ... . the book's sub-title The Lab on a Tip is entirely appropriate. I thoroughly recommend this book to anyone who is interested in applying any SPM technique ... . (Dr. M. Salt, Contemporary Physics, Vol. 45 (6), 2004)
Erscheint lt. Verlag | 27.8.2003 |
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Reihe/Serie | Advanced Texts in Physics |
Zusatzinfo | X, 210 p. 204 illus., 15 illus. in color. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 540 g |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
Naturwissenschaften ► Chemie ► Physikalische Chemie | |
Naturwissenschaften ► Physik / Astronomie | |
Technik ► Maschinenbau | |
Schlagworte | Experiment • Helium-Atom-Streuung • Microscopy • Mikroskopie • Nanoscience • Pes • Scanning Probe Microscopy • Surface Science |
ISBN-10 | 3-540-43180-2 / 3540431802 |
ISBN-13 | 978-3-540-43180-0 / 9783540431800 |
Zustand | Neuware |
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