Scanning Probe Microscopy - Ernst Meyer, Hans Josef Hug, Roland Bennewitz

Scanning Probe Microscopy

The Lab on a Tip
Buch | Softcover
X, 210 Seiten
2011 | Softcover reprint of the original 1st ed. 2004
Springer Berlin (Verlag)
978-3-642-07737-1 (ISBN)
69,99 inkl. MwSt
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Two decades after its invention, scanning probe microscopy has become a widely used method in laboratories as diverse as industrial magnetic stor age development or structural biology. Consequently, the community of users ranges from biologists and medical researchers to physicists and engineers, all of them exploiting the unrivalled resolution and profiting from the relative simplicity of the experimental implementation. In recent years the authors have taught numerous courses on scanning probe microscopy, normally in combination with hands-on student experi ments. The audiences ranged from physics freshmen to biology post-docs and even high-school teachers. We found it of particular importance to cover not only the physical principles behind scanning probe microscopy but also ques tions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. With this book our intention is to provide a gen eral textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy labora tory.

1 Introduction to Scanning Probe Microscopy.- 2 Introduction to Scanning Tunneling Microscopy.- 3 Force Microscopy.- 4 MFM and Related Techniques.- 5 Other Members of the SPM Family.- 6 Artifacts in SPM.- 7 Prospects for SPM.- References.

Erscheint lt. Verlag 22.9.2011
Reihe/Serie Advanced Texts in Physics
Zusatzinfo X, 210 p. 204 illus., 15 illus. in color.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 344 g
Themenwelt Naturwissenschaften Chemie Analytische Chemie
Naturwissenschaften Physik / Astronomie
Technik Maschinenbau
Schlagworte Experiment • Helium-Atom-Streuung • Microscopy • Nanoscience • Pes • Scanning Probe Microscopy • Surface Science
ISBN-10 3-642-07737-4 / 3642077374
ISBN-13 978-3-642-07737-1 / 9783642077371
Zustand Neuware
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