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Advances in Optical and Electron Microscopy

Buch | Hardcover

376 Seiten

1997
Academic Press Inc (Verlag)
978-0-12-029912-6 (ISBN)

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The volumes in this series plot progress and innovation in optical and electron microscopy at a fundamental level. The series also describes relevant applications for microscopic techniques in biology, materials science research and industrial inspection. The book also covers material of interest to those in the field of microscope instrumentation.

The invention of the electron Fresnal interference biprism, G.Mollenstedt; electron image plane off-axis holography of atom structures, H.Lichte; magnetic through-the-lens detection in electron microscopy and spectroscopy, P.Kruit; advances in voltage contrast detectors in scanning electron microscopes, L.Dubbeldam; scanning near-field optical microscopy (SNOM), D.W.Phol; microscopic thermal wave non-destructive testing, J.Hartikuinen et al.

Erscheint lt. Verlag	28.11.1997
Reihe/Serie	Advances in Optical & Electron Microscopy S. ; vol 12
Verlagsort	San Diego
Sprache	englisch
Maße	165 x 241 mm
Gewicht	704 g
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Optik
ISBN-10	0-12-029912-7 / 0120299127
ISBN-13	978-0-12-029912-6 / 9780120299126
Zustand	Neuware