Advances in Optical and Electron Microscopy (eBook)

Front Cover 1
Advances in Optical and Electron Microscopy 4
Copyright Page 5
Contributors 6
Preface 8
Table of Contents 10
Chapter 1. The Invention of the Electron Fresnel Interference Biprism 14
I. Childhood years in Bielefeld 14
II. Gaining technical know-how as a student apprentice 15
III. A broad education in physics with Professor Walter Kossel 15
IV. Influence of the work of kikuchi and convergent beam diffraction 16
V. Electron-optical experiments with Brüche, Scherzer and Mahl 18
VI. Quantitative testing of the operation of the biprism 25
VII. Measurement of the inner potential of solids 32
VIII. Electron interference microscope in the transmission mode 34
IX. The intensity problem in electron interferometers 34
X. Atomic resolution electron holography 34
Chapter 2. Electron Image Plane Off-axis Holography of Atomic Structures 38
I. Introduction 38
II. Principles of off-axis image plane electron holography 46
III. Performance of image plane electron holography 54
IV. Influence of the lens aberrations in the high-resolution domain 73
V. Reconstruction of the image wave and correction of aberrations 82
VI. Experimental realization of holography of atomic structures 84
VII. Conclusion 97
References 103
Chapter 3. Magnetic Through-the-lens Detection in Electron Microscopy and Spectroscopy, Part 1 106
I. Introduction 106
II. Historical development of through-the-lens detection 109
III. Historical development of the magnetic parallelizer for spectroscopy applications 126
IV. Theory of adiabatic motion 132
V. Summary 147
References 148
Chapter 4. Advances in Voltage-Contrast Detectors in Scanning Electron Microscopes 152
I. Introduction 153
II. Test techniques for integrated circuits 153
III. Secondary electrons 168
IV. Voltage-contrast detectors 195
V. Design of a double channel spectrometer 204
VI. Measurements 229
VII. Future developments 247
VIII. Conclusions 248
IX. List of symbols 250
Acknowledgements 250
References 251
Chapter 5. Scanning Near-field Optical Microscopy (SNOM) 256
I. Introduction 256
II. Historical background 260
III. Theoretical background 265
IV. Experimental work 285
V. DISCUSSION 319
Acknowledgements 322
References 322
Chapter 6. Microscopic Thermal Wave Non-destructive Testing 326
I. Introduction 326
II. Thermal waves and their generation 328
III. The resolution of the thermal wave microscope 334
IV. Photothermal NDE techniques with periodic heating 338
V. Photothermal pulse and scanning methods 351
VI. Experimental pulse techniques 358
VII. Conclusion 365
References 369
INDEX 374