Frontiers in Optical Methods
Springer Berlin (Verlag)
978-3-662-50731-5 (ISBN)
This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.
State-of-Art of Terahertz Science and Technology.- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films.- Single Photon Counting and Passive Microscopy of Terahertz Radiation.- Coherent Phonons in Carbon Nanotubes.- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation.- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures.- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy.- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring.- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique.- Terahertz Light Source Based on Synchrotron Radiation.- Terahertz Synchrotron Radiation; Optics and Application.- Far-infrared Spectroscopy on Solids under Ultra High Pressures.- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.
| Erscheinungsdatum | 29.08.2016 |
|---|---|
| Reihe/Serie | Springer Series in Optical Sciences |
| Zusatzinfo | XII, 228 p. 139 illus., 70 illus. in color. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Optik |
| Technik ► Elektrotechnik / Energietechnik | |
| Schlagworte | Applied Optics • atomic and molecular physics • Atomic, Molecular, Optical and Plasma Physics • extreme methods in optical measurements • Laser laser • Laser technology and holography • Laser Technology, Photonics • Microstructures • Microwaves, RF and Optical Engineering • Microwave technology • nanotechnology • optical physics • Optics, Optoelectronics, Plasmonics and Optical De • phonon techniques • Physics and Astronomy • Scientific equipment, experiments and techniques • Spectroscopy and Microscopy • Spectrum analysis, spectrochemistry, mass spectrom • surface differential reflectance spectroscopy • Synchrotron radiation • THz spectroscopy • Ultrafast spectroscopy • wave propagation in thin films and • X-ray technicques |
| ISBN-10 | 3-662-50731-5 / 3662507315 |
| ISBN-13 | 978-3-662-50731-5 / 9783662507315 |
| Zustand | Neuware |
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