Frontiers in Optical Methods

Nano-Characterization and Coherent Control
Buch | Hardcover
XII, 228 Seiten
2013 | 2014
Springer Berlin (Verlag)
978-3-642-40593-8 (ISBN)
106,99 inkl. MwSt
This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.

State-of-Art of Terahertz Science and Technology.- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films.- Single Photon Counting and Passive Microscopy of Terahertz Radiation.- Coherent Phonons in Carbon Nanotubes.- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation.- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures.- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy.- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring.- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique.- Terahertz Light Source Based on Synchrotron Radiation.- Terahertz Synchrotron Radiation; Optics and Application.- Far-infrared Spectroscopy on Solids under Ultra High Pressures.- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.

Erscheint lt. Verlag 17.12.2013
Reihe/Serie Springer Series in Optical Sciences
Zusatzinfo XII, 228 p. 139 illus., 70 illus. in color.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 526 g
Themenwelt Naturwissenschaften Physik / Astronomie Optik
Technik Elektrotechnik / Energietechnik
Schlagworte extreme methods in optical measurements • Laser laser • Microstructures • phonon techniques • surface differential reflectance spectroscopy • Synchrotron radiation • THz spectroscopy • Ultrafast spectroscopy • wave propagation in thin films and • X-ray technicques
ISBN-10 3-642-40593-2 / 3642405932
ISBN-13 978-3-642-40593-8 / 9783642405938
Zustand Neuware
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