Frontiers in Optical Methods
Springer Berlin (Verlag)
978-3-642-40593-8 (ISBN)
State-of-Art of Terahertz Science and Technology.- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films.- Single Photon Counting and Passive Microscopy of Terahertz Radiation.- Coherent Phonons in Carbon Nanotubes.- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation.- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures.- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy.- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring.- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique.- Terahertz Light Source Based on Synchrotron Radiation.- Terahertz Synchrotron Radiation; Optics and Application.- Far-infrared Spectroscopy on Solids under Ultra High Pressures.- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.
Erscheint lt. Verlag | 17.12.2013 |
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Reihe/Serie | Springer Series in Optical Sciences |
Zusatzinfo | XII, 228 p. 139 illus., 70 illus. in color. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 526 g |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Optik |
Technik ► Elektrotechnik / Energietechnik | |
Schlagworte | extreme methods in optical measurements • Laser laser • Microstructures • phonon techniques • surface differential reflectance spectroscopy • Synchrotron radiation • THz spectroscopy • Ultrafast spectroscopy • wave propagation in thin films and • X-ray technicques |
ISBN-10 | 3-642-40593-2 / 3642405932 |
ISBN-13 | 978-3-642-40593-8 / 9783642405938 |
Zustand | Neuware |
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