Optical Measurement of Surface Topography
Springer Berlin (Verlag)
978-3-642-42684-1 (ISBN)
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Richard Leach, Executive Pastry Chef at the Park Avenue Cafe, was named Pastry Chef of the Year by the James Beard Foundation in 1997. He has twice been recognized as one of the Top Ten Pastry Chefs of America by Chocolatier magazine. A graduate of The Culinary Institute of America, he has worked at Aureole, Lespinasse, Symphony Cafe, and La Cote Basque.
Introduction to surface texture measurement.- Some common terms and definitions.- Limitations of optical 3D sensors.- Calibration of optical surface topography measuring instruments.- Chromatic confocal microscopy.- Point autofocus instruments.- Focus variation instruments.- Phase shifting interferometry.- Coherence scanning interferometry.- Digital holographic microscopy.- Imaging confocal microscopy.- Light scattering methods
From the reviews:
"This book shows how optical microscopy can be used in the characterization and metrology of various surfaces. ... Several important methods are presented in a clear and simple way ... . The case studies scattered throughout the text greatly improve the readability and contribute to the practical emphasis of this book. ... the index is comprehensive. I recommend this book to anyone trying to find the most appropriate method for surface topography measurement, as well as researchers who are new to using microscopy for measurements." (Dejan Pantelic, Optics & Photonics News, December, 2011)
| Erscheint lt. Verlag | 14.11.2014 |
|---|---|
| Zusatzinfo | XIII, 323 p. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 522 g |
| Themenwelt | Naturwissenschaften |
| Technik ► Elektrotechnik / Energietechnik | |
| Technik ► Maschinenbau | |
| Schlagworte | Confocal microscopy • Instrument calibration • Scattering Methods • Surface Roughness • Topography characterization |
| ISBN-10 | 3-642-42684-0 / 3642426840 |
| ISBN-13 | 978-3-642-42684-1 / 9783642426841 |
| Zustand | Neuware |
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