The Uncertainty in Physical Measurements
Springer-Verlag New York Inc.
978-0-387-78649-0 (ISBN)
Since 1978, the author has worked on x-ray spectroscopy (XAFS) with Synchrotron Radiation. He participated in the realization of the PWA laboratories at Adone (Frascati) and of the italian beamline BM08-Gilda at ESRF (Grenoble). He regularly performs XAFS measurements at international synchrotron facilities, including Adone (Frascati), LURE (Orsay), ESRF (Grenoble). Prof. Fornasini has also developed a software package for the analysis of EXAFS, specifically tailored for the study of anharmonic thermal effects. Prof. Fornasini has been a member of the International Advisory Committee on Synchrotron Radiation in Materials Science since 1996 and given several invited lectures and seminars in Chester (UK), Bonn, Regensburg, Bad Honnef, Dakar, Warsaw, Frascati, Bologna, Corvallis (Oregon), Stanford University, Hirosaki (Japan), Chiba (Japan). Since 1997, he is a lecturer at the Italian School of Synchrotron Radiation, organized every two years by the "Società Italiana di Luce di Sincrotrone". He has given lectures on x-ray techniques in various Italian and international schools (Torino 1999, Rostock 2000, Varsaw 2004, Planneralm Austria 2005, Dakar 2005). Prof. Fornasini is the author or co-author of over 100 papers published in international journals and referees of the journals: Physical Review Letters, Physical Review B, Physics Letters, and Journal of Synchrotron Radiation.
Measurements and Uncertainty.- Physical Quantities.- Measurement Units.- Measuring Instruments.- Uncertainty in Direct Measurements.- Probability and Statistics.- Basic Probability Concepts.- Distributions of Random Variables.- Statistical Tools.- Data Analysis.- Uncertainty in Indirect Measurements.- Confidence Levels.- Correlation of Physical Quantities.- The Chi Square Test.- Appendices.- Presentation of Experimental Data.- Systems of Units.- Tables.- Mathematical Complements.- Experiments.
Erscheint lt. Verlag | 6.10.2008 |
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Zusatzinfo | XII, 289 p. |
Verlagsort | New York, NY |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Mathematik / Informatik ► Informatik ► Theorie / Studium |
Naturwissenschaften ► Physik / Astronomie ► Mechanik | |
Technik | |
ISBN-10 | 0-387-78649-X / 038778649X |
ISBN-13 | 978-0-387-78649-0 / 9780387786490 |
Zustand | Neuware |
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