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Circuit Design for Reliability

Ricardo Reis, Yu Cao, Gilson Wirth (Herausgeber)

Buch | Hardcover

272 Seiten

2014
Springer-Verlag New York Inc.
978-1-4614-4077-2 (ISBN)

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This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.

Zusatzinfo	132 Illustrations, color; 58 Illustrations, black and white; VI, 272 p. 190 illus., 132 illus. in color.
Verlagsort	New York, NY
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Informatik ► Weitere Themen ► CAD-Programme
	Technik ► Bauwesen
	Technik ► Elektrotechnik / Energietechnik
	Technik ► Maschinenbau
ISBN-10	1-4614-4077-7 / 1461440777
ISBN-13	978-1-4614-4077-2 / 9781461440772
Zustand	Neuware