Reliability of MEMS
Wiley-VCH (Verlag)
978-3-527-31494-2 (ISBN)
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Osamu Tabata received his Ph.D. degree from Nagoya Institute of Technology, Japan, in 1993. From 1981 to 1996, he performed industrial research at Toyota Central Research and Development Laboratories in Aichi, Japan. He then joined the Department of Mechanical Engineering of Ritsumeikan University in Shiga, Japan, and spent Guest Professorships at IMTEK Freiburg, Germany, and at ETH Zurich, Switzerland. In 2003, he joined the Kyoto University, Japan. Currently, he is the Professor at Micro Engineering Department. Professor Tabata is engaged in the research of micro/nano processes, MEMS and micro/nano system synthetic engineering (SENS). He was honored with the Science News Award in 1987, Presentation Paper Award in 1992, and received the R&D 100 Award in 1993 and 1998, Best Poster Award of 19th Sensor Symposium on Sensors, Micromachines, and Applied Systems in 2002, Best Patent Award from Ritsumeikan University in 2004. He is a senior member of the Institute of Electrical Engineers of Japan, a member of the Japan Society of Mechanical Engineers and a senior member of the Institute of Electrical and Electronics Engineers. Toshiyuki Tsuchiya received his Ph.D. degree from Nagoya University, Japan, in 2002. From 1993 to 2004, he carried out industrial research at Toyota Central Research and Development Laboratories in Aichi, Japan. In 2004, he joined the Department of Mechanical Engineering of Kyoto University and is currently Associate Professor in the Department of Microengineering. Toshiyuki Tsuchiya's current research is focused on mechanical properties evaluation of micro/nano materials and MEMS and micro/nano system synthetic engineering (SENS). He received the R&D 100 Award in 1998.
Evaluation of Mechanical Properties of MEMS Materials and their Standardization
Elastoplastic Indentation Contact Mechanics of Homogeneous Materials and Coating-Substrate Systems
Thin-film Characterization Using the Bulge Test
Uniaxial Tensile Test for MEMS Materials
On-chip Testing of MEMS
Reliability of a Capacitive Pressure Sensore
Inertial Sensors
High-accuracy, High-reliability MEMS Accelerometer
Reliability of MEMS Variable Optical Attenuator
Eco Scan MEMS Resonant Mirror
"The book will undoubtedly be of interest to MEMS practitioners and researchers." ( Journal of Applied Electrochemistry , February 2008)
Erscheint lt. Verlag | 12.12.2007 |
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Reihe/Serie | Advanced Micro and Nanosystems ; 6 |
Mitarbeit |
Herausgeber (Serie): Oliver Brand, Gary K. Fedder, Christofer Hierold, Jan G. Korvink |
Sprache | englisch |
Maße | 170 x 240 mm |
Gewicht | 750 g |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
Schlagworte | Analytical Chemistry • Analytische Chemie • Chemie • Chemistry • Control Systems Technology • Electrical & Electronics Engineering • Electrical & Electronics Engineering • Electronic materials • Electronic Packaging • Elektronikbauteile • Elektronische Materialien • Elektrotechnik u. Elektronik • Halbleiter • Industrial Chemistry • Materials Science • Materialwissenschaften • MEMS • MEMS (Mikroelektromechanische Systeme) • Mikroelektromechanik • Mustererkennung • Nanotechnologie • nanotechnology • Pattern Analysis • Regelungstechnik • Robotics • Robotik • semiconductors • Sensoren • Sensoren, Instrumente u. Messung • Sensor Materials • Sensors, Instrumentation & Measurement • Sensors, Instrumentation & Measurement • Technische u. Industrielle Chemie |
ISBN-10 | 3-527-31494-6 / 3527314946 |
ISBN-13 | 978-3-527-31494-2 / 9783527314942 |
Zustand | Neuware |
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