Thin Films
Springer International Publishing (Verlag)
978-3-031-06618-4 (ISBN)
The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials' physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies.
Dr. Nicoleta Nedelcu is a Scientific Researcher III at the Institute of Solid Mechanics of the Romanian Academy in Bucharest, Romania. Born in 1984 with a Ph.D. degree in Chemistry to the Romanian Academy 2019. Her doctoral research focused on thin films deposition and surface characterization. She graduated since 2008 the Faculty of Physics at Ovidius University and in 2009 graduated the Master's in Condensed matter physics and nanostructure systems. She started to worked like Research Assistant in 2010 at Institute of Chemistry Physics "Ilie Murgulescu" and in 2011 she was worked as Engineer Physicist in optical coating designer for UV-VIS-NIR-IR spectral range at OphirOptics brand of NewPort Corporation. She worked since 2017-2018 in scientific research for the development of national, primary and reference standards and traceability to SI units at National Institute of Metrology. She started in 2019 to work at the Institute of Solid Mechanics of the Romanian Academy.In 2022 she moved to Calgary Canada for new opportunities in scientific research.
Chapter 1. Introduction.- Chapter 2. Thin layer method.- Chapter 3. Vacuum thin film deposition installation.- Chapter 4. Method for characterizing thin layer.- Chapter 5. Study of optical and chemical properties.
| Erscheinungsdatum | 09.04.2024 |
|---|---|
| Zusatzinfo | X, 124 p. 94 illus., 79 illus. in color. |
| Verlagsort | Cham |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Technik ► Maschinenbau |
| Schlagworte | Chemical vacuum deposition • FT-IR • materials characterization • materials processing • Microscopy techniques • Raman spectroscopy • Spectro-ellipsometry • Thermal evaporation • Thin Films • UV-Vis Spectroscopy |
| ISBN-10 | 3-031-06618-9 / 3031066189 |
| ISBN-13 | 978-3-031-06618-4 / 9783031066184 |
| Zustand | Neuware |
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