Electron Nano-imaging
Springer Verlag, Japan
978-4-431-56939-8 (ISBN)
- Noch nicht erschienen - erscheint am 30.08.2024
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Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC) and Nagoya Industrial Science Research Institute (NISRI). He received a Ph.D. degree from Applied Physics Department of Nagoya University in 1978 and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004 and IMaSS in 2015. He was the director of the institute from 2012 to 2015. He was also the president of Japanese Microscopy Society (JSM) from 2015 to 2017.
Chapter 1 Seeing nanometer-sized world.- Chgapter 2 Structure and imaging of a transmission electron microscope (TEM).- Chapter 3 Basic theories of TEM imaging.- Chapter 4 Resolution and image contrast of a transmission electron microscope (TEM).- Chapter 5 What is high-resolution transmission electron microscopy ?.
Erscheinungsdatum | 03.08.2024 |
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Zusatzinfo | 13 Illustrations, color; 129 Illustrations, black and white; XXX, 384 p. 142 illus., 13 illus. in color. |
Verlagsort | Tokyo |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
Technik ► Maschinenbau | |
Schlagworte | Aberration Corrector • Annular Bright Field (ABF) STEM • Annular Dark Field (ADF) STEM • Continuous or Pulsed Electron Sources • Contrast Transfer Function (CTF) • Differential Phase Contrast (DPC) STEM • Electron-energy Loss Spectroscopy (EELS) • Electron Nano-diffraction • Energy-filtered TEM (EFTEM) • High-resolution Electron Microscopy • Image Contrast of TEM and STEM • Image Simulation • Lattice-fringe Imaging in TEM • monochromator • Nanometer-sized Objects • Scanning Transmission Electron Microscopy (STEM) • Sparse-coding Image Processing • Structure Image in TEM • Transmission Electron Microscopy (TEM) |
ISBN-10 | 4-431-56939-1 / 4431569391 |
ISBN-13 | 978-4-431-56939-8 / 9784431569398 |
Zustand | Neuware |
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