Principles of Semiconductor Network Testing - Amir Afshar

Principles of Semiconductor Network Testing

(Autor)

Buch | Hardcover
350 Seiten
1996
Newnes (an imprint of Butterworth-Heinemann Ltd ) (Verlag)
978-0-7506-9472-8 (ISBN)
54,85 inkl. MwSt
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Aimed at test and process professionals, this book provides techniques which help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. It addresses the fundamental issues underlying the semiconductor test discipline.
Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Diode and transistor operationIntegrated circuit test basicsDigital logic testNoise identificationOperational amplifier general informationData acquisition devicesDigital signal processingCODEC (Coder/Decoder)

Erscheint lt. Verlag 22.4.1996
Verlagsort Oxford
Sprache englisch
Maße 152 x 235 mm
Gewicht 600 g
Themenwelt Naturwissenschaften Physik / Astronomie Festkörperphysik
Technik Elektrotechnik / Energietechnik
ISBN-10 0-7506-9472-6 / 0750694726
ISBN-13 978-0-7506-9472-8 / 9780750694728
Zustand Neuware
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