Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices

1/f Noise Sources.- Noise Sources in GaN/AlGaN Quantum Wells and Devices.- 1/f Noise in Nanomaterials and Nanostructurea: Old Questions in a New Fashion.- 1/f Spectra as a Consequence of the Randomness of Variance.- Quantum Phase Locking, 1/f Noise and Entanglement.- Shot Noise in Mesoscopic Devices and Quantum Dot Networks.- Super-Poissonian Noise in Nanostructures.- Stochastic and Deterministic Models of Noise.- Noise in Optoelectronic Devices.- Fluctuations of Optical and Electrical Parameters and Their Correlation of Multiple-Quantum-Well INGAAS/INP Lasers.- Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels.- Noise of High Temperature Superconducting Bolometers.- 1/f Noise in MOSTs: Faster is Noisier.- Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs.- Noise and Tunneling Through the 2.5 nm Gate Oxide in Soi MOSFETs.- Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors.- Noise Modelling in Low Dimensional Electronic Structures.- Correlation Noise Measurements and Modeling of Nanoscale MOSFETs.- Tunneling Effects and Low Frequency Noise of GaN/GaAlN HFETs.- High Frequency Noise Sources Extraction in Nanometique MOSFETs.- Iiformative “Passport Data” of Surface Nano- and Mocrostrucures.- Noise Measurement Technique.- Techniques for High-Sensitivity Measurements of Shot Noise in Nanostructures.- Correlation Spectrum Analyzer: Pringiples and Limits in Noise Measurements.- Measurement and Analysis Methods for Random Telegraph Signals.- RTS in Quantum Dots and MOSFETs: Experimental Set-Up with Long-Time Stability and Magnetic Field Compensation.- Some Considerations for the Construction of Low-Noise Amplifiers in Very Low Frequency Region.-Measurements of Low Frequency Noise in Nano-Grained RuO2+Glass Films Below 1 K.- Technique for Investigation of Non-Gaussian and Non-Stationary Properties of LF Noise in Nanoscale Semiconductor Devices.- The Noise Background Suppression of Noise Measuring Set-UP.- Accuracy of Noise Measurements for 1/f and GR Noise.- Radiofrequency and Microwave Noise Metrology.- Treatment of Noise Data in Laplace Plane.- Measurement of Noise Parameter Set in the Low Frequency Range: Requirements and Instrumentation.- Techniques of Interference Reduction in Probe System for Wafer Level Noise Measurements of Submicron Semiconductor Devices.- Hooge Mobility Fluctuations in n-InSb Magnetoresistors As a Reference for Access Resistance LF-Noise Measurements of SiGe Metamorphic HMOS FETs.- Optimised Preamplifier for LF-Noise MOSFET Characterization.- Net of YBCO and LSMO Thermometers for Bolometric Applications.- Diagnostics of GaAs Light Emitting Diode pn Junctions.- New Tools For Fast And Senstive Noise Measurements.- Using a Novel, Computer Controlled Automatic System for LF Noise Measurements Under Point Probes.