Material Characterization Techniques and Applications - Euth Ortiz Ortega, Hamed Hosseinian, Ingrid Berenice Aguilar Meza, María José Rosales López, Andrea Rodríguez Vera

Material Characterization Techniques and Applications

Buch | Softcover
305 Seiten
2023 | 1st ed. 2022
Springer Verlag, Singapore
978-981-16-9571-1 (ISBN)
171,19 inkl. MwSt
This book presents commonly applied characterization techniques in material science, their brief history and origins, mechanism of operation, advantages and disadvantages, their biosensing applications, and troubleshooting for each technique, while addressing the challenges researchers face when working with these techniques. The book dedicates its focus to identifying physicochemical and electrochemical nature of materials including analyses of morphology, mass spectrometry, and topography, as well as the characterization of elemental, structural, thermal, wettability, electrochemical, and chromatography properties. Additionally, the main features and benefits of using coupled characterization techniques are discussed in this book.

Dr. Euth Ortiz-Ortega obtained his PhD in Engineering (microfluidic devices for energy conversion) from the University of Queretaro, Mexico. Currently, he is working as a Postdoctoral Researcher at the School of Engineering and Sciences, Tecnologico de Monterrey, Mexico. His research interests are in the area of electrochemical devices, carbon functionalization, electrochemical characterization of nanostructured materials, and bio-sensing.   Hamed Hosseinian obtained his Masters in Genetics from the University of Science and Arts, Yazd, Iran. His major research focus is on development of a fiber-based platform for biosensing applications. Currently, Hamed is pursuing his PhD at the School of Engineering and Sciences, Tecnologico de Monterrey.   Ingrid Berenice Aguilar Meza Obtained her Master of Science in Biomaterials and Regenerative Medicine from The University of Sheffield, the United Kingdom. Currently, she is studying her PhDin Nanotechnology at Tecnologico de Monterrey, Mexico.    María José Rosales López obtained her bachelor degree in Sociology and Psychology at DePaul University in Illinois, United States. She has recently obtained her second bachelor’s in Chemical Engineering with a minor in Industrial Engineering at Tecnologico de Monterrey, Mexico.    Andrea Rodríguez Vera is studying a bachelor’s degree in Biomedical Engineering with a minor in Biomedical Micro-Technology at Tecnologico de Monterrey, Mexico. She is also a Research Assistant at Neuro-Acoustics and Neuro-Engineering Research Group of Tecnologico de Monterrey.   ​Dr. Samira Hosseini obtained her Ph.D. in Biomedical Engineering from the the University of Malaya, Kuala Lumpur, Malaysia. She served as a postdoctoral associate at Tecnologico de Monterrey, Mexico while holding a postdoctoral fellowship at Massachusetts Institute of Technology, Cambridge, USA. Currently, she is Director of Writing Lab in the Center for Educational Innovation at Tecnologico de Monterrey, Mexico. She also holds the position of research professor at the School of Engineering and Sciences, Tecnologico de Monterrey. She is a member of the Mexican National Academy of Researchers.

Characterization techniques for morphology analysis.- Characterization techniques for mass spectrometry analysis.- Characterization techniques for topography analysis.- Characterization techniques for chemical and structural analyses.- Characterization techniques for thermal analysis.- Characterization techniques for wettability analysis.- Characterization techniques for electrochemical analysis.- Characterization techniques for chromatography analysis.- Coupled characterization techniques.

Erscheinungsdatum
Reihe/Serie Progress in Optical Science and Photonics
Zusatzinfo 127 Illustrations, color; 11 Illustrations, black and white; XV, 305 p. 138 illus., 127 illus. in color.
Verlagsort Singapore
Sprache englisch
Maße 155 x 235 mm
Themenwelt Naturwissenschaften Chemie Analytische Chemie
Naturwissenschaften Physik / Astronomie Optik
Technik Maschinenbau
Schlagworte Atomic Force Microscopy (AFM) • DRIFT spectroscopy • Electrochemical Impedance Spectroscopy (EIS) • Fourier Transform Infrared Spectroscopy (FTIR) • High-performance liquid chromatography (HPLC) • MALDI-TOF Spectrometry • Optical microscopy • Raman spectroscopy • Scanning Electron Microscopy (SEM) • Thermal gravimetric analysis (TGA) • Transmission Electron Microscopy Analysis (TEM) • Wettability Analysis • x-ray photoelectron spectroscopy (XPS)
ISBN-10 981-16-9571-7 / 9811695717
ISBN-13 978-981-16-9571-1 / 9789811695711
Zustand Neuware
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