GaN Transistor Modeling for RF and Power Electronics

Yogesh Singh Chauhan is a Professor at the Indian Institute of Technology Kanpur. His research interests include the physics, characterization, and modeling of nanoscale semiconductor devices, and RF circuit design. He is the developer of several industry standard models, including the BSIM-BULK (BSIM6), BSIM-IMG, BSIM-CMG and ASM-HEMT models. Ahtisham Pampori is a doctoral student at the Indian Institute of Technology Kanpur (IIT Kanpur), currently working on the characterization and modeling of GaN HEMT RF devices. He is one of the developers of ASM-HEMT, an industry standard model for AlGaN/GaN HEMTs. His research is focused on the modeling and characterization of GaN HEMTs and their applications in RF systems. He is a recipient of the prestigious Prime Minister's Research Fellowship (PMRF). He holds his bachelor’s degree in Electronics and Communications Engineering from NIT Srinagar. Sheikh Aamir Ahsan received his PhD from Nanolab, Indian Institute of Technology Kanpur in 2017. He is currently an Assistant Professor of Electronics and Communication Engineering with the National Institute of Technology Srinagar, where he is involved in nanoelectronic device - simulation and theoretical modeling for circuit design. He was a visiting researcher with Keysight Technologies in 2016 and a postdoc at the New York University in 2018. He is the co-developer of the Industry Standard ASM-GaN-HEMT Model and also the winner of the Science and Engineering Research Board Early Career Research Award 2019.

Part I: Introduction
1. GaN Device Physics
2. GaN HEMT Models

Part II: ASM-HEMT Model
3. Surface Potential, 2DEG, and Drain Current Model 
4. Self-Heating and Temperature Effects
5. Noise and Gate Current

Part III: ASM-HEMT for GaN Power Electronics 
6. GaN Power Device Characterization
7. Terminal Charges and Capacitances
8. TCAD Simulation
9. Switching Collapse

Part IV: ASM-HEMT for GaN RF Electronics
10. Characterization of RF GaN HEMTs
11. RF Modeling-I 
12. RF Modeling-II

Part V: Miscellaneous
13. Parameter Extraction
14. Model Quality Testing