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Extreme Ultraviolet Lithography

Buch | Softcover
245 Seiten
2020
SPIE Press (Verlag)
978-1-5106-3939-3 (ISBN)
79,95 inkl. MwSt
Covers the many aspects of lithographic technology that needed to be addressed in order to make EUV lithography ready for high-volume manufacturing: exposure tools, light sources, masks, resists, process control, metrology, and computational lithography. Each topic is approached from the perspective of a practicing lithographer.
This book covers the many aspects of lithographic technology that needed to be addressed in order to make EUV lithography ready for high-volume manufacturing: exposure tools, light sources, masks, resists, process control, metrology, and computational lithography. Lithography costs, which have often influenced the areas of technical focus, are discussed. Potential improvements to current EUV technology and extensions to future nodes are also covered. Each topic is approached from the perspective of a practicing lithographer in a wafer fab, in either manufacturing or development, and there are many references at the end of each chapter.

Introduction
Sources of EUV Light
EUV Exposure Systems
EUV Masks
EUV Resists
Computational Lithography for EUV
Process Control for EUV Lithography
Metrology for EUV Lithography
EUV Lithography Costs
Extending EUV Lithography

Erscheinungsdatum
Reihe/Serie SPIE Press Monographs
Verlagsort Bellingham
Sprache englisch
Themenwelt Technik Elektrotechnik / Energietechnik
ISBN-10 1-5106-3939-X / 151063939X
ISBN-13 978-1-5106-3939-3 / 9781510639393
Zustand Neuware
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