Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis

These are the papers presented at the ESREF 2002. Two new topics in 2002 are optical devices and microelectromechanical systems (MEMS); both have attracted a high number of scientific contributions. The book contains nine invited papers and approximately 100 submitted contributions

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This Proceedings contains the papers presented at the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2002), held in Bellaria, Italy, 7-11 Oct 2002. The Proceedings are being published concurrently as a special issue of Microelectronics Reliability.

Since its foundation in 1990, the annual ESREF symposium has been the premier European forum for the discussion of research in all aspects of specification, technology and manufacturing, test, control and analysis for microelectronic devices and circuits. Researchers at top institutions, in Europe and elsewhere, present high-quality experimental results at ESREF. The ESREF Proceedings have been published by Elsevier Science since 1996.

This year's Proceedings follow the format and style of previous books in the series, and as always the list of topics addressed changes to keep up with developments in the field. Two new topics this year are optical devices and microelectromechanical systems (MEMS); both have attracted a high number of scientific contributions.

The Proceedings contains nine invited papers and approximately 100 submitted contributions on the following topics:

•Quality and reliability techniques for components and system
•Failure mechanisms in silicon devices
•Failure mechanisms in compound semiconductors devices
•Non-volatile and programmable device reliability
•Power devices reliability
•Photonics reliability
•Packaging and assembly reliability
•Advanced failure analysis: defect detection and analysis
•Electron and optical beam testing (EOBT)
•Electrostatic discharge (ESD)
•MEMS/MOEMS (Special Session)

All papers are reviewed prior to publication.

In this, the 40th year of publication of the journal Microelectronics Reliability, two of the invited papers are contributed by senior members of the Journal's Editorial Board, and are dedicated to that anniversary.

This Proceedings will be indispensable for scientists and engineers working on the quality and reliability of microelectronic devices and circuits, and for anyone with a general interest in microelectronics research.

For more information on Microelectronics Reliability, visit http://www.elsevier.com/locate/microrelhttp://www.elsevier.com/locate/microrel