Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis -

Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis

Blaise Ravelo, Zhifei Xu (Herausgeber)

Buch | Hardcover
400 Seiten
2020
Institution of Engineering and Technology (Verlag)
978-1-83953-049-4 (ISBN)
159,95 inkl. MwSt
This book describes a fast, accurate and flexible modelling methodology for PCBs. With its systematic approach to addressing tensorial analysis of networks (TAN) modelling methods, the book provides information and solutions to the designers and manufacturers of analogue, RF, digital and mixed signal electronic circuits and systems.
This book describes a fast, accurate and flexible modelling methodology for PCBs. The model uses the concept of tensorial analysis of networks (TAN) based on Kron's and Kron-Branin's methods adapted for the EMC use by O. Maurice. The TAN approach is applied to the PCB SI and electromagnetic compatibility (EMC) analysis.


Each chapter presents a methodology consisting of the problem formulation, classical circuit description, TAN primitive elements, TAN graph topology elaboration, problem metric mathematization and the posed-problem resolution based on Python and Matlab routine algorithms. This methodical approach has been applied to the following topics: basic knowledge to practice TAN for PCB SI/PI/EMC investigation; PCB primitive components analysis with TAN; analytical calculation of PCB trace Z/Y/T/S matrices with TAN approach; fast S-parameter Kron-Branin's modelling of rectangular wave guide (RWG) structure via mesh impedance reduction; time domain TAN modelling of PCB system with Kron's method; direct time-domain analysis with TAN method for PCB modelling; coupling between EM field and multilayer PCB with MKME; conducted emissions (CE) EMC TAN modelling; PCB conducted susceptibility (CS) EMC TAN modelling; PCB radiated susceptibility (RS) EMC TAN modelling; TAN model of loop probe coupling onto shielded coaxial short-cable; nonlinear behaviour conduced EMC model of an ADC based mixed PCB under radio frequency interference (RFI); far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs; and element of information for numerical modelling on PCB.


With its highly systematic approach to addressing TAN modelling methods, this book provides key information and novel solutions to the designers and manufacturers of analogue, RF, digital and mixed signal electronic circuits and systems.

Blaise Ravelo is a professor at NUIST University, China. His research interests include multiphysics and electronics engineering, and he is a pioneer of the negative group delay (NGD) concept. He was research director of nine PhD students and regularly involved in EU R&D&I-projects. He is member of IET Electronics Letters editorial board as circuit & system subject editor, and has (co)authored more than 250 papers in peer-reviewed journals and conferences. Zhifei Xu is a postdoctoral researcher at the Missouri S&T EMC Laboratory, Missouri University of Science and Technology, Rolla, USA. His research area covers signal integrity, power integrity and EMC analysis with different models on multilayer PCBs. His current publications are focused on the Kron-Branin model for multilayer PCB modeling applications.

Chapter 1: General introduction
Chapter 2: Basic knowledge to practice TAN for PCB SI/PI/EMC investigation
Chapter 3: CB primitive components analysis with TAN
Chapter 4: Analytical calculation of PCB trace Z/Y/T/S matrices with TAN approach
Chapter 5: Fast S-parameter Kron-Branin's modelling of rectangular wave guide (RWG) structure via mesh impedance reduction
Chapter 6: Time-domain TAN modelling of PCB-lumped system with Kron's method
Chapter 7: Direct time-domain analysis with TAN method for distributed PCB modelling
Chapter 8: Coupling between EM field and multilayer PCB with MKME
Chapter 9: Conducted emissions (CEs) EMC TAN modelling
Chapter 10: PCB-conducted susceptibility (CS) EMC TAN modelling
Chapter 11: PCB-radiated susceptibility (RS) EMC TAN modelling
Chapter 12: TAN model of loop probe coupling onto shielded coaxial short cable
Chapter 13: Nonlinear behaviour conduced EMC model of an ADC-based mixed PCB under radio-frequency interference (RFI)
Chapter 14: Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs
Chapter 15: Element of information for numerical modelling on PCB: focus on boundary element method
Chapter 16: General conclusion

Erscheinungsdatum
Reihe/Serie Materials, Circuits and Devices
Verlagsort Stevenage
Sprache englisch
Maße 156 x 234 mm
Themenwelt Technik Elektrotechnik / Energietechnik
ISBN-10 1-83953-049-9 / 1839530499
ISBN-13 978-1-83953-049-4 / 9781839530494
Zustand Neuware
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