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Combined Analysis
Seiten
2010
John Wiley & Sons Inc (Hersteller)
978-1-118-62250-6 (ISBN)
John Wiley & Sons Inc (Hersteller)
978-1-118-62250-6 (ISBN)
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This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.
Daniel Chateigner is Professor at the University of Caen Lower Normandy in France.
Erscheint lt. Verlag | 7.7.2010 |
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Verlagsort | New York |
Sprache | englisch |
Maße | 150 x 250 mm |
Gewicht | 28 g |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
ISBN-10 | 1-118-62250-2 / 1118622502 |
ISBN-13 | 978-1-118-62250-6 / 9781118622506 |
Zustand | Neuware |
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