Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements - Yuming Zhuang, Degang Chen

Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements

Buch | Softcover
XIV, 170 Seiten
2019 | 1. Softcover reprint of the original 1st ed. 2018
Springer International Publishing (Verlag)
978-3-030-08520-9 (ISBN)
139,09 inkl. MwSt
This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.

Yuming Zhuang is a Senior Product and Design Engineer in the Corporate R&D division, at Qualcomm Inc, in San Diego, California. Degang Chen is the Jerry Junkins Chair Professor in the Department of Electrical and Computer Engineering, at Iowa State University, in Ames, Iowa.

Chapter 1. Introduction.- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion.- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency.- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing.- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration.- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test.- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test.- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio.- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise.- Chapter 10.Summary.


Erscheinungsdatum
Zusatzinfo XIV, 170 p. 89 illus., 88 illus. in color.
Verlagsort Cham
Sprache englisch
Maße 155 x 235 mm
Gewicht 290 g
Themenwelt Technik Elektrotechnik / Energietechnik
Schlagworte Accurate Spectral Testing • ADC testing methods • DAC-ADC Co-Testing • Design, Modeling and Testing of Data Converters • Mixed-Signal IC Test and Measurement
ISBN-10 3-030-08520-1 / 3030085201
ISBN-13 978-3-030-08520-9 / 9783030085209
Zustand Neuware
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