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X–Ray Physics for Free–Electron Laser Applications

(Autor)

Buch | Hardcover
325 Seiten
2023
Wiley-VCH Verlag GmbH
978-3-527-41387-4 (ISBN)
155,85 inkl. MwSt

Stefan P. Hau-Riege is the Applied Physics Associate Division Leader at Lawrence Livermore National Laboratory (LLNL) where he works on XFEL interactions with materials, x-ray instrumentation, and ultrafast imaging, using both on computational and experimental physics. Previously he worked on extreme-ultraviolet lithography and laser-assisted recrystallization. Dr. Hau-Riege received his PhD in materials science from MIT in 2000, and a MS in solid-state physics and applied mathematics from the University of Hamburg, Germany. He has authored and co-authored more than 210 scientific publications and is co-inventor of more than 20 patents.

INTRODUCTION
Introduction to XFELs and Their History
XFELs Applied to Different Scientific Disciplines
Energy, Time, and Length Scales of XFEL-Matter Interaction

RADIATIVE AND ATOMIC PROCESSES
Atomic States
Radiative Atomic Processes
Nonradiative Atomic Processes
Effect of Plasma Environment
Quantum X-Ray Physics
Available Databases

ELECTRON DYNAMICS IN MATERIALS
Electron Scattering
Energy Loss Mechanisms in Materials
Electron Dynamics in Plasmas
Statistical Description of Electron Dynamics
Charge Trapping in Small Objects

DYNAMICS OF X-RAY-IRRADIATED MATERIALS
Transition of Condensed Matter to A Plasma
X-Ray-Matter Interaction Time Scales
the Effect of X-Ray Heating on Absorption
Thermal Phase Transformation
Nonthermal Phase Transformation
Ablation
X-Ray-Induced Mechanical Damage
Nonuniform Heating
Simulation of the Dynamics of X-Ray?Irradiated Materials

SCATTERING OF X-RAY RADIATION
Scattering by Free Charges
Scattering by Atoms and Ions
Resonant X-Ray Scattering
Scattering by Molecules, Gases, Liquids, and Amorphous Solids
Scattering by Plasmas
Scattering by Crystals

ELECTROMAGNETIC WAVE PROPAGATION
Coherence Properties
Optical Properties of Materials and Kramers-Kronig Relation
Electromagnetic Waves Propagation
Dispersive Interaction of Wave Packets with Materials
Reflection and Refraction at Interfaces
Imaging Techniques

X-RAY SOURCES
Review of Conventional Laboratory X-Ray Sources
Synchrotron Radiation
Insertion Devices
Synchrotrons and Energy-Recovery Linacs
XFEL
Compact XFEL Sources
Current XFEL Facilities

X-RAY OPTICS
Compound Refractive Lenses
Zone Plates
Grazing Incidence Mirrors
Reflective Thin Films and Multilayers
Crystal Optics
Single-Pulse X-Ray Optics

X-RAY DIAGNOSTICS
Pulse Energy
Coherence
Pulse Size
Characterizing Short X-Ray Pulses

EXAMPLES OF XFEL APPLICATIONS
Photochemistry
Biological Structure Determination
X-Ray Scattering Diagnostics of Dense Plasmas

Erscheint lt. Verlag 28.6.2023
Verlagsort Weinheim
Sprache englisch
Maße 170 x 244 mm
Themenwelt Naturwissenschaften Chemie
Naturwissenschaften Physik / Astronomie
Technik Maschinenbau
ISBN-10 3-527-41387-1 / 3527413871
ISBN-13 978-3-527-41387-4 / 9783527413874
Zustand Neuware
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