ICP Emission Spectrometry

Joachim Nölte studied and completed his PhD degree in environmental analysis at the University of Hamburg, Germany. His work has focussed on ICP OES since 1981 and he has worked at Perkin Elmer on method development. He has extensive experience in teaching the method through courses and presentations. In 2000 he founded a consulting agency called AnalytikSupport.

OVERVIEW
Analytic features of the ICP OES
ICP OES - definitions
Distribution of the ICP emission spectrometers
Complimentary techniques for elemental analysis
MIP and LIPS
Symbols, abbreviations and acronyms used

PLASMA
The analytically used plasma
Argon
Added gases (e.g. Oxygen or Nitrogen)
Materials used for ICP torches
Orientation of the plasma (e.g. vertical vs. horizontal)
Excitation to emit electromagnetic radiation
High-frequency generator
Sample introduction system
Nebulizers

OPTICS AND DETECTOR OF THE SPECTROMETER
Principles of optics
Detector
Emission spectrometer mounts
Scanning Array Spectrometers
Simultaneous Array Spectrometers

METHOD DEVELOPMENT
Wavelength selection
Reference to NIST-Atlas
Processing and correction techniques
Non-spectral interferences
Optimization
Validation
Procedure to check linearity

ROUTINE ANALYSIS
Preliminary steps
Calibration
Quality control
Software and data management

TROUBLE SHOOTING

APPLICATIONS
General Notes
Notes on specific elements
Selected applications

INSTRUMENT PURCHASING AND LABORATORY PREPARATION
Which technique in atomic spectrometry is preferred?
Which ICP emission spectrometer is best for the application?
Preparation of the laboratory

LITERATURE
INDEX