Für diesen Artikel ist leider kein Bild verfügbar.

Advances in Imaging and Electron Physics

Buch | Hardcover
362 Seiten
2019
Academic Press Inc (Verlag)
978-0-12-817177-6 (ISBN)
209,95 inkl. MwSt
Advances in Imaging and Electron Physics, Volume 209, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.

1. Introduction to EELS Alberto Eljarrat Ascunce 2. Low-loss EELS methods Alberto Eljarrat Ascunce 3. DFT modeling of wurtzite III-nitride ternary alloys Alberto Eljarrat Ascunce 4. AlN/GaN and InAlN/GaN DBRs Alberto Eljarrat Ascunce 5. Multiple InGaN QW heterostructure Alberto Eljarrat Ascunce 6. Er-doped Si-nc/SiO2 multilayer Alberto Eljarrat Ascunce 7. Si-NCs embedded in dielectric matrices Alberto Eljarrat Ascunce 8. EELS Conclusions Alberto Eljarrat Ascunce 9. High-Tc Superconductors and Magnetic Electron Lenses Jan-Peter Adriaanse

Erscheinungsdatum
Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes, Martin Hÿtch
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 450 g
Themenwelt Mathematik / Informatik Informatik
Technik Elektrotechnik / Energietechnik
Technik Maschinenbau
ISBN-10 0-12-817177-4 / 0128171774
ISBN-13 978-0-12-817177-6 / 9780128171776
Zustand Neuware
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich
den digitalen Office-Notizblock effizient nutzen für PC, Tablet und …

von Philip Kiefer

Buch | Softcover (2023)
Markt + Technik Verlag
9,95
ein Bericht aus Digitalien

von Peter Reichl

Buch (2023)
Muery Salzmann (Verlag)
19,00