Next Generation and Advanced Network Reliability Analysis
Springer International Publishing (Verlag)
978-3-030-01646-3 (ISBN)
- Covers reliability analysis of advanced networks and provides basic mathematical tools and analysis techniques and methodology for reliability and quality assessment;
- Develops Markov and Software Engineering Models to predict reliability;
- Covers both hardware and software reliability for next generation technologies.
Syed R. Ali, DEE, is currently CEO and Principal of Software Reliability Research, LLC conducting upfront research and consultation with sophisticated software tools and methodologies for companies and organizations that seek state-of-the-art reliability analysis of their products and services for Next Generation Networks (NGN), Virtualized Networks, emerging wireless and other technologies. The objective of his organization is to provide high reliability framework for assessing and measuring overall operational end-to-end reliability of complex real-time mission critical systems. Syed was principal consultant at Bell Communications Research for over 30 years and was instrumental in setting up industry wide metrics was measuring software quality at all life cycle phases. He pioneered the concept of software fault insertion techniques for increasing software reliability before its released. While at Telcordia (formerly Bellcore) he developed Telcordia’s In-Process Quality Metrics (IPQM, GR-1315), Object Oriented Process Metrics (OOPM, SR-4047), and contributed to many IEEE and ISO standards. He is author of book “Digital Switching Systems -System Reliability Analysis published by McGraw-Hill, 1997, ISBN 0-07-001069-2. Syed is an expert in the field with extensive experience in analyzing reliability of advanced network architectures around the world. He has consulted with Ericcson (Sweden), Nortel (Canada), Siemens (Germany), NEC (Japan), Alcatel, (France), Singtel (Singapore), and Fujitsu (Japan) and has supported many international standard bodies. Syed is the past chairperson of IEEE Communications and co-founder of Computer Society New York Section. He is a frequent speaker at many IEEE and international telecommunications forums and is regarded as a leader in the field of reliability. Syed received his BSEE from Bangladesh University of Engineering & Technology (BUET), MSEE from Tuskegee University, Tuskegee Alabama and DEE from New Jersey Institute of Technology, Newark, NJ.
Introduction.- Next Generation Network.- Hardware Reliability Modeling.- Software Reliability Analysis.- Software Defined Networking.- Network Functions Virtualization.- Cloud Computing Reliability Analysis.- Next Generation Transport System.- Reliability Analysis of VoIP System.- Reliability Analysis of Wireless Systems.- Reliability Testing For Advanced Networks.- Conclusion.
Erscheinungsdatum | 16.11.2018 |
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Reihe/Serie | Signals and Communication Technology |
Zusatzinfo | XXVI, 311 p. 182 illus., 168 illus. in color. |
Verlagsort | Cham |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 667 g |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
Technik ► Nachrichtentechnik | |
Schlagworte | Cost of Fixing Defective Software • Defensive Programming • Failure Intensity • Failure Mode • Five Nine Reliability • Markov model • Mean Time Between Failure • Media Gateway • Next Generation Network • Optical Network • Packet Network • Quality Control, Reliability, Safety and Risk • quality of experience • Quality of Service • reliability block diagram • Sensitivity Analysis • Short Message Service • software dependability • software reliability engineering • Wireless Network |
ISBN-10 | 3-030-01646-3 / 3030016463 |
ISBN-13 | 978-3-030-01646-3 / 9783030016463 |
Zustand | Neuware |
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