Für diesen Artikel ist leider kein Bild verfügbar.

Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects

Buch | Hardcover
376 Seiten
2018
CRC Press (Verlag)
978-1-138-41418-1 (ISBN)
149,60 inkl. MwSt
A publication of the French Society of Microscopies, this book is devoted to an important aspect of electron diffraction. The description of convergent-beam electron diffraction and of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out.
A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.

The author Jean- Paul Morniroli is a professor in the Ecole Nationale Superieure de Chimie of Lille: his research is performed in the Laboratoire de Metallurgie et Genie des Materiaux CNRS 8517 of the Universite des Sciences at Technologies de Lille. He is a specialist in electron diffraction. The translator Etienne Bres is a Professor in the Universite des Sciences at Technologies de Lille, He is a specialist in the nanoscale characterization of biological and synthetic nanomaterials.

Introduction I - Bragg's law II - Formation of the diffraction pattern in the electron microscope III- Electron diffraction patterns produced by a parallel incident beam IV- Diffraction pattern produced by a convergent incident beam: CBED pattern V - Diffraction pattern produced by a large-angle convergent incident beam: Kossel pattern VI - Diffraction pattern produced by a large-angle convergent beam: LACBED Patterns VII- Diffracted and transmitted intensities XI - Characterization of crystal defects from LACBED patterns VIII- Experimental methods IX- LACBED variants X - Indexing LACBED patterns Conclusion

Erscheinungsdatum
Verlagsort London
Sprache englisch
Maße 152 x 229 mm
Gewicht 990 g
Themenwelt Naturwissenschaften Biologie
Naturwissenschaften Physik / Astronomie Allgemeines / Lexika
Naturwissenschaften Physik / Astronomie Festkörperphysik
Naturwissenschaften Physik / Astronomie Optik
Technik Elektrotechnik / Energietechnik
Technik Umwelttechnik / Biotechnologie
ISBN-10 1-138-41418-2 / 1138414182
ISBN-13 978-1-138-41418-1 / 9781138414181
Zustand Neuware
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich
Das Lehrbuch

von Wilhelm Kulisch; Regine Freudenstein

Buch | Softcover (2024)
Wiley-VCH (Verlag)
39,99
für Studierende der Naturwissenschaften und Technik

von Paul A. Tipler; Peter Kersten; Gene Mosca

Buch | Hardcover (2024)
Springer Spektrum (Verlag)
79,99