Electron Crystallography -

Electron Crystallography

Buch | Hardcover
440 Seiten
1997
Springer (Verlag)
978-0-7923-4876-4 (ISBN)
406,59 inkl. MwSt
The re-emergent field of quantitative electron crystallography is described by some of its most eminent practitioners. They describe the theoretical framework for electron scattering, specimen preparation, experimental techniques for optimum data collection, the methodology of structure analysis and refinement, and a range of applications to inorganic materials (including minerals), linear polymers, small organic molecules (including those used in nonlinear optical devices), incommensurately modulated structures (including superconductors), alloys, and integral membrane proteins. The connection between electron crystallography and X-ray crystallography is clearly defined, especially in the utilisation of the latest methods for direct determination of crystallographic phases, as well as the unique role of image analysis of high-resolution electron micrographs for phase determination. Even the aspect of multiple beam dynamic diffraction (once dreaded because it was thought to preclude ab initio analysis) is considered as a beneficial aid for symmetry determination as well as the elucidation of crystallographic phases, and as a criterion for monitoring the progress of structure refinement. Whereas other texts have hitherto preferentially dealt with the analysis of electron diffraction and image data from thin organic materials, this work discusses - with considerable optimism - the prospects of looking at `harder' materials, composed of heavier atoms.
Audience: Could be used with profit as a graduate-level course on electron crystallography. Researchers in the area will find a statement of current progress in the field.

1. Background.- The development of electron crystallography — in memory of Boris Konstantinovich Vainshtein (1921–1996).- 2. Experimental Techniques and Simulations.- Solid state structures.- Image formation and image contrast in HREM.- Electron microscopy techniques.- Definition, measurement and calculation of intensities in electron diffraction.- Convergent beam electron diffraction. Basic principles.- Convergent-beam electron diffraction.- Image simulation in high resolution transmission electron microscopy.- 3. Crystallographic Phase Determination.- The phase problem of x-ray crystallography: overview.- The effects of symmetry in real and reciprocal space.- Obtaining phases from electron microscopy for solving protein structures. Tribute to Boris Vainshtein (1921–1996).- Crystal structure determination by crystallographic image processing: I. HREM images, structure factors and projected potential.- Crystal structure determination by crystallographic image processing: II.Compensate for defocus, astigmatism, and crystal tilt.- An introduction to maximum entropy in action.- Multi-dimensional direct methods.- Crystal structure determination by two-stage image processing.- Success is not guaranteed — practical matters for direct phase determination in electron crystallography.- 4. Structure Refinement.- Crystal structure refinement incorporating chemical information.- Least squares refinement of structures from dynamic electron diffraction data.- Fourier refinement in electron crystallography.- Structure refinement through matching of experimental and simulated HRTEM images.- 5. Applications.- Direct methods versus electron diffraction: the first experiences by SIR97.- Structure determination by electron crystallography using a simulation approach combined withmaximum entropy with the aim of improving materials properties.- Multi-dimensional electron crystallography of Bi-based superconductors.- Structure determination by maximum entropy and likelihood.- Crystallographic image processing on minerals: 3D structures, defects and interfaces.- Electron diffraction in polymer crystal structure analysis: some examples.- Membrane proteins solved by electron microscopy and electron diffraction.- The need for electron crystallography in mineral sciences..- Electron diffraction of mineral structures and textures.- Extended Abstracts.- Structural electron microscopy characterization of the ternary compound S4In2Zn obtained by chemical transport..- Diffraction contrast in TEM images of modulated semiconductor alloys.- Electron crystallography of a metal azo salt pigment.- Systematic study of metal particles (Pt, Ni) contrast on amorphous support (silica) using multislice.- First steps in the structure determination of an oxycarbonate superconductor from electron diffraction intensities..- Effects of local crystallography on stress-induced voiding in passivated copper interconnects.- How to determine reliable intensities using film methods?.- Surface structures solved by direct methods.- Modulated structure determination of Pb-1212 and Pb-1223 by electron crystallographic image processing.- TEM studies of the early stages of precipitation in Al-Mg-Si alloys in comparison with electron radiation damage effects..- Structural models of ?2-inflated monoclinic and orthorhombic Al-Co phases.- Electron microscopy of thin protein crystals from vapour diffusion ‘hanging drops’ provides structural information at intermediate resolution.- Structural modulations in the Sr-Ca-Cu-0 system characterized by HRTEM.- Investigation of defects inplastically deformed Ni3A1 by TEM tilting experiments.- Oxidation in-situ of Nbl2O29 into a high resolution microscope.- Electron diffraction patterns of natural antigorites: a still unknown modulated crystal structure.- Exact atom positions by electron microscopy? — a quantitative comparison to X-ray crystallography.- WINREKS — A computer program for the reciprocal lattice reconstruction from a set of electron diffractograms.- Crystallographic phase transitions in laser irradiated cerium dioxide.

Erscheint lt. Verlag 30.11.1997
Reihe/Serie NATO Science Series E ; 347
Zusatzinfo XVIII, 440 p.
Verlagsort Dordrecht
Sprache englisch
Maße 156 x 234 mm
Themenwelt Naturwissenschaften Chemie Physikalische Chemie
Naturwissenschaften Geowissenschaften Mineralogie / Paläontologie
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Naturwissenschaften Physik / Astronomie Festkörperphysik
Technik Maschinenbau
ISBN-10 0-7923-4876-1 / 0792348761
ISBN-13 978-0-7923-4876-4 / 9780792348764
Zustand Neuware
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