Advances in Imaging and Electron Physics

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

1. Micro-XRF in Scanning Electron MicroscopesM. Haschke and S. Boehm2. A Variational Approach for Simulation of Equilibrium Ion Distributions in Ion Traps with Regard to Coulomb InteractionI.A. Kopaev, D. Grinfeld, M.A. Monastyrskiy, R.S. Ablizen, S.S. Alimpiev and A.A. Trubitsyn3. Analytical Review of Direct STEM Imaging Techniques for Thin SamplesI. Lazic and E.G.T. Bosch4. Quantum Nano-Optics in the Electron MicroscopeL.H.G. Tizei and M. Kociak5. Component Identification and Interpretation: A Perspective on Tower of KnowledgeM. Xu, J. Ren and Z. Wang