Analog and Mixed Signal Test
A Recent History
Seiten
2020
|
1st ed. 2021
Springer International Publishing (Verlag)
978-3-319-21181-7 (ISBN)
Springer International Publishing (Verlag)
978-3-319-21181-7 (ISBN)
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This book serves as a "go-to" guide to the most important research in the last 20 years in analog and mixed-signal test. Topics covered include: analog Built-in Self-test, analog design-for-test, IEEE standards based test for analog and mixed-signal circuits, RF test, Data Converter (DAC/ADC) testing, automatic test equipment, alternate test, machine learning and big data solutions for analog/mixed-signal systems-on-chip. The author has designed the presentation so that readers can get up to speed quickly in the various cutting-edge topics in mixed signal research, or use the information as a guide for diving more deeply into the most relevant literature, without losing time.
Suraj Sindia is a Q&R Engineering Manager at Intel Corporation, in Hilsboro, Oregon.
Introduction to Analog and Mixed-Signal test.- Analog and mixed-signal test equipment.- Design-for-test techniques for AMS-IC.- Alternate test.- Yield and test cost optimization.- Emerging test methods.
Erscheint lt. Verlag | 23.12.2020 |
---|---|
Reihe/Serie | SpringerBriefs in Electrical and Computer Engineering |
Zusatzinfo | 75 p. 50 illus. |
Verlagsort | Cham |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Technik ► Elektrotechnik / Energietechnik |
Schlagworte | AMS-IC • Analog and mixed-signal test • Analog BIST • DAC/ADC Testing • Design-for-test for AMS-IC • Machine Learning in Mixed-signal Test • System-on-Chip Testing • VLSI Testing |
ISBN-10 | 3-319-21181-1 / 3319211811 |
ISBN-13 | 978-3-319-21181-7 / 9783319211817 |
Zustand | Neuware |
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