Embedded Mechatronic Systems, Volume 1 -

Embedded Mechatronic Systems, Volume 1

Analysis of Failures, Predictive Reliability
Buch | Hardcover
262 Seiten
2015
ISTE Press Ltd - Elsevier Inc (Verlag)
978-1-78548-013-3 (ISBN)
109,95 inkl. MwSt
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In operation, mechatronics embedded systems are stressed by loads of different causes: climate (temperature, humidity), vibration, electrical and electromagnetic. These stresses in components which induce failure mechanisms should be identified and modeled for better control. AUDACE is a collaborative project of the cluster Mov'eo that address issues specific to mechatronic reliability embedded systems. AUDACE means analyzing the causes of failure of components of mechatronic systems onboard. The goal of the project is to optimize the design of mechatronic devices by reliability.

The project brings together public sector laboratories that have expertise in analysis and modeling of failure, major groups of mechatronics (Valeo and Thales) in the automotive and aerospace and small and medium enterprises that have skills in characterization and validation tests

Abdelkhalak El Hami is Professeur des universités at the Institut National des Sciences Appliquées (INSA-Rouen) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics and Head of the department of mechanical engineering of INSA Normandy, as well as several European pedagogical projects. He is an expert in fluid–structure interaction studies, reliability and optimization.

1. Predictive Reliability of Embedded Electronic Systems
2. Measuring Method of the Internal Temperature of Electronic Components 
3. Dynamic Analysis of Mechatronic Components by Laser Vibrometry 
4. Measurement of Static and Vibratory Deformations and Displacements by Full Field Methods 
5. Characterization of the Electromagnetic Environment of Microwave Frequency Circuits 
6. Characterization of the Behavior of Radiofrequency Power Transistors under Thermal and Electromagnetic Stresses
7. Characterization of the Ability of Switching Transistors to Resist to Electrical Overstress
8. Spectroscopy of Non-destructive Characterizations of the Interface Physics of Mechatronics Devices
9. Study of the Dynamic Contact between Deformable Solids

Sprache englisch
Maße 152 x 229 mm
Gewicht 520 g
Themenwelt Technik Elektrotechnik / Energietechnik
Technik Maschinenbau
ISBN-10 1-78548-013-8 / 1785480138
ISBN-13 978-1-78548-013-3 / 9781785480133
Zustand Neuware
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