Hot Carrier Degradation in Semiconductor Devices (eBook)

Tibor Grasser is an Associate Professor at the Institute for Microelectronics for Technische Universität Wien.

Part I: Beyond Lucky Electrons.- From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation.- The Energy Driven Hot Carrier Model.- Hot-Carrier Degradation in Decananometer.- Physics-based Modeling of Hot-carrier Degradation.- The Spherical Harmonics ExpansionMethod for Assessing Hot Carrier Degradation.- Recovery from Hot Carrier Induced Degradation Through Temperature Treatment.- Characterization of MOSFET Interface States Using the Charge Pumping Technique.- Part II: CMOS and Beyond.- Channel Hot Carriers in SiGe and Ge pMOSFETs.- Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs.- Characterization and Modeling of High-Voltage LDMOS Transistors.- Compact modelling of the Hot-carrier Degradation of Integrated HV MOSFETs.- Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors.- Part III: Circuits.- Hot-Carrier Injection Degradation in Advanced CMOS nodes: A bottom-up approach to circuit and system reliability.- Circuit Reliability – Hot Carrier Stress of MOS-transistors in Different Fields of Application.- Reliability Simulation Models for Hot Carrier Degradation.